Anchor Semiconductor offers pattern-matching tool

Report from the 2007 Design Automation Conference, June 4-8, San Diego, CA.

-- Test & Measurement World, 6/6/2007 8:39:00 AM

Anchor Semiconductor is now offering its NanoScope tool for checking layout before manufacturing to identify potential structural problems. The tool uses pattern matching to examine chip layouts and predict potential “hot spots” where diffraction effects during lithography can distort the layout causing opens or shorts.

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