Vendors demonstrate test products at DAC 2007
-- Test & Measurement World, 6/6/2007 8:45:00 AM
Here is a look at the test-related announcements at the Design Automation Conference held June 4-8, 2007.
Vendors pursue new DFT strategies
Breker tackles test synthesisARM unleashes adaptive verification IP
NI highlights PXI Anchor Semiconductor offers pattern-matching tool
Knowlent previews analog Test Bench Builder Synplicity unveils at-speed ASIC verification MathWorks automates test generation for model-based designs Also see DAC coverage from our sister publication:
EDN Guides: 2007 Design Automation Conference
