Testing devices with multiple RF ports

-- Test & Measurement World, 6/26/2007 6:00:00 AM

Verigy’s Port Scale RF V93000 system provides the RF measurement capability required to test emerging high integration devices containing integrated RF, mixed-signal, digital, and power-management devices as well as embedded or stacked memory. It includes a 6-GHz RF source card, an RF front-end card that provides 12 RF ports, an RF interface, an MB AV8 card, and a 48-port RF calibration kit that can support up to 10 RF systems.

"The emerging high-integration devices being manufactured today to power the next-generation of mobile consumer electronics devices are posing significant challenges to our customers," said Ronde. “The architecture of the V93000 platform allows us to add this RF capability while achieving remarkable throughput, and still maintaining the lowest cost-of-test."

The system targets devices that integrate multiple radios on a single IC that conforms to multiple communications standards, such as WiMAX, WLAN, Bluetooth, UWB, GSM/CDMA, CDMA2000, EDGE, and EV-DO. The Port Scale RF system embodies all of its RF resources in the V93000 test head while offering a noise floor down to -161 dBm/Hz. he system can be configured with 12, 24, or 48 RF ports.

The Port Scale RF system features integrated analog and RF test setup, integrated test flow, and step-by-step debug tools to reduce test development time. Verigy has one-click intelligent calibration and now uses an Eclipse software environment with an active hardware view, which provides the user with an intuitive, graphical view of the RF measurement block diagram.

Base price: $320,000.

Next page: Gathering test data for nanoelectronics
Previous page: Consumer mixed-signal test

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

• Topics
• Author

Related Content

 

By This Author

There are no other articles written by this author.

Sponsored Links

TMW Resource Center

Browse Resources by Type:

• Application Note
• Case Study
• Data Sheet
• Design Guide
• Evaluation Kit
• Product Catalog
• Product Demo
• Reference Guide
• Software
• Web Event
• White Paper

• Evaluating Oscilloscopes for Best Signal Visibility: How to Increase Your Odds of Finding Infrequent Glitches
  Agilent Technologies | Application Note
  VIEW NOW
• Back-to-Basics: Measurement-Based Channel Modeling for Signal Integrity using Agilent ADS
  Agilent Technologies | Web Event
  VIEW NOW
• The Fundamentals of Signal Integrity
  Tektronix | Web Event
  VIEW NOW

View More