Show Highlights
By Staff -- Test & Measurement World, 7/1/2007
RF tools run gamut from EDA to production test
MTT-S International Microwave Symposium, June 3–8, 2007, Honolulu, HI, IEEE Microwave Theory and Techniques Society, www.ims2007.org.
The 50-MHz to 18-GHz NRP-Z81 USB-enabled sensor combines an RF detector with analog- and digital-signal-processing capability to add full power-meter functionality to a PC. Courtesy of Rohde & Schwarz.
Rohde & Schwarz demonstrated a true differential large-signal measurement technique for balanced active RF and microwave devices. The company also presented the ZVL combined vector network analyzer and spectrum analyzer; the FMU36 baseband spectrum and vector signal analyzer; the AMU200A, which combines signal generators and faders; the NRP-Z81 USB-enabled sensor; and for its 24-GHz ZVA24 and 40-GHz ZVA40 four-port vector network analyzers, the ZVA-Z110 option, which allows the instruments to make measurements between 75 and 110 GHz (W band).
Anritsu debuted its 6-GHz MS2690A and 13-GHz MS2691A signal analyzers. The company also introduced new portable Site Master analyzers for P25 and Tetra systems. Giga-tronics displayed its new 2520GTA signal generator. The 20-GHz instrument offers frequency and amplitude switching speeds of better than 350 µs for any step size over its full frequency range.
| See our complete coverage of the 2007 MTT-S International Microwave Symposium. |
Temptronic highlighted its new MobileTemp system, which supports the test of standard and high-frequency devices, assemblies, modules, PCBs, and multiple UUTs from –65° to +200°C in a compact mobile enclosure located at the tester site. Agilent Technologies exhibited instruments such as its 10-MHz to 26.5-GHz PNA-X microwave network analyzer, the MXG signal generator and MXA signal analyzer, and a series of LXI (class A-certified) synthetic instruments. Agilent also announced that it is integrating its Electromagnetic Design System (EMDS) full-wave 3-D simulator into the company’s Advanced Design System (ADS) EDA software platform.
National Instruments presented its PXI RF switch offerings and demonstrated PXI systems for RFID and other RF measurement applications. Cascade Microtech highlighted enhancements to its WinCal XE device-characterization tools. Aeroflex demonstrated its 3-Hz to 3-, 13.2-, and 26.5-GHz 3280 series spectrum analyzers, which now offer digital demodulation capabilities for 802.11a/b/g signals.
Peregrine Semiconductor announced that, through a collaborative effort with Oki Semiconductor, Oki is shipping in production volumes RFICs employing Peregrine’s 0.5-micron UltraCMOS. Peregrine also introduced several flip-chip RF-switch ICs.
EDA firms tackle feature-dependent defects
Design Automation Conference, June 4–8, 2007, San Diego, CA, IEEE, EDA Consortium, and SIGDA, www.dac.com.
Cadence, Mentor Graphics, and Synopsys all said they are pursuing design for test (DFT) along several fronts to accommodate a shift from random fabrication defects to feature-dependent defects. The three EDA companies are offering tools that allow test engineers to perform what some call “volume diagnostics” and others refer to as “defect diagnostics”—these tools gather data on errors found during the test of many devices, then make that data available for engineers to analyze.
| See our complete coverage of the 2007 Design Automation Conference. |
The MathWorks introduced its Simulink Design Verifier, a software tool that generates tests and proves the design properties of model-based designs. Models can be implemented in Simulink or Stateflow using the Prover plug-in from Prover Technology. National Instruments highlighted the role of PXI in benchtop semiconductor test. A demonstration system at the NI booth showed how PXI could be used in the test of ICs, including digital and mixed-signal ICs.
Breker Verification Systems released Trek, a functional test synthesis tool that analyzes a verification plan for coverage and then generates test vectors. ARM announced the AMBA adaptive verification engine, which extracts and applies traffic profile information to predict how designs will perform. Anchor Semiconductor highlighted its NanoScope tool, which uses pattern matching to examine chip layouts.
Knowlent previewed its analog Opal Test Bench Builder, currently in beta test, which leverages the company’s Viper test language to capture design specifics and generate simulator-specific test code. Synplicity released its Confirma platform, a hardware-assisted verification platform for FPGA-based prototyping of ASIC and ASSP designs.
