2008 Test Engineer of the Year Nominee:
James J. Grealish

-- Test & Measurement World, 10/1/2007

BOARD TEST

Describing Grealish's work, Kenneth P. Parker, Senior Scientist at Agilent Technologies, said, "Fostering and facilitating change sets James (“JJ”) Grealish apart from his fellow test engineers. JJ has a distinguished 25-year career in PCB test. He has spent the last 12 years as the senior board test technologist with Intel’s Test Development Engineering group in Portland, OR. JJ is a technical visionary with the ability to see a developing problem on the horizon, identify potential solutions, and drive collaboration.

"JJ established a cooperative effort between Intel and Agilent Technologies which led to the successful integration of the Agilent Bead Probes into products now in volume production worldwide. Pioneering this partnership has enabled in-circuit test (ICT) innovation across the entire market—not just for the two companies involved.

"The work enabled by JJ has established that solder-bead probing is not only feasible in a high-volume production environment, but can be successfully implemented without any increase in cost or restrictions to design flexibility. Data associated with this work was documented in a paper presented by JJ at the International Test Conference in 2006. The collaboration has opened the door for ICT to remain successful, viable, and most importantly, a cost-effective diagnostic tool for years to come.

"JJ is also an active member of the iNEMI group, working with other senior technology leaders from various OEM’s with the goal of finding common solutions to future test challenges."

Read more about Grealish's work:

• JJ Grealish’s 2006 International Test Conference paper on "Implementation of Solder-bead Probing in High Volume Manufacturing." 
• Agilent wins EDN award for Bead Probe technology. 
• Benefits of Bead Probe technology. 
• JJ Grealish’s 2006 Board Test Workshop paper on the challenges of testing Fully Buffered DIMM memory, using the IEEE P1581 initiative (an alternative to Boundary Scan in memory devices).
• iNEMI Board and Systems Manufacturing Test TIG (Technology Integration Group), which identifies future test challenges. Grealish is a key member of the group. 

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