ITC: Inovys touts Sun purchase
-- Test & Measurement World, 10/31/2007 5:04:00 AM
Representatives of Inovys were on hand at the International Test Conference to tout Sun Microsystems’ purchase of multiple Inovys Zero Foot Print (ZFP) test systems that have been coupled with Inovys SpeedScan for high-speed characterization of Sun’s complex, ultra high-speed devices. SpeedScan, a toolset that uses AC-scan techniques for identifying path delay and transition delay faults, enables Sun to rapidly run patterns automatically across a range of frequencies and see failures directly at the scan flop.
“The Inovys solution has worked virtually seamlessly with our extremely complex, high-speed, energy efficient UltraSPARC Chip multi-threaded (CMT) CPUs,” commented Sridhar Vajapey, VP, Technology, Validation and Test, Microelectronics Group, Sun Microsystems. “Having the ability to successfully test our ultra high-speed UltraSPARC CMT CPUs on low-cost DFT testers has proved extremely valuable. Also, we have consistently found Inovys hardware to be reliable and their software tools easy to use, and design engineers with minimal training are quickly able to realize the full capabilities of the tool.”
Said Paul Sakamoto, president and CEO of Inovys, “We are pleased to be providing Sun with innovative hardware and software tools that are consistently able to meet their increasingly complicated and ever-changing needs.”
Talkback
Related Content
Related Content
Sponsored Links
TMW Resource Center
Browse Resources by Type:
- What’s New in NI Multisim 10.1? For Education
National Instruments | White Paper
VIEW NOW
National Instruments | White Paper
VIEW NOW
National Instruments | White Paper
VIEW NOW
View More
