WITec combines 3-D chemical imaging with AFM
-- Test & Measurement World, 12/18/2007 8:20:00 AM
According to WITec, its alpha500 and alpha700 are the first instruments on the market to combine confocal Raman microscopy for 3-D chemical imaging and atomic force microscopy (AFM) for high-resolution structural imaging in an automated system. The instruments are said to significantly reduce the overall experiment duration and deliver a greater amount of data in a given time for resource-minimized routine research or high-level quality control.
A motorized sample stage with a travel range of 150X100 mm for the alpha 500 and 350X300 mm for the alpha700 allows multi-area/multi-point measurements or overview scans on an arbitrary, user-defined number of measurement points. Specific automated functions, such as integrated auto-focus and an automatic AFM-tip, guarantee that standardized routine measurement procedures or manually defined sequences can be performed without any ongoing process control by an operator.
The alpha500 and alpha700 incorporate a piezo-driven scan stage with capacitive feedback control and dynamic position control (TrueScan) for high-resolution confocal Raman imaging and AFM measurements. In the Raman imaging mode, a complete spectrum is acquired in as little as 760 µs at each image pixel, resulting in images consisting of tens of thousands of Raman spectra being collected in less than a minute. Differences in chemical composition are apparent in the Raman image and can be analyzed with a spatial resolution down to 200 nm. By simply rotating the objective turret, AFM capabilities are accessible.
The automated design of the alpha500 and alpha700 is beneficial for imaging applications involving systematic procedures and routine operations, as well as large sample analysis. Applications include wafer inspection, pharmaceutical screening, standardized coating, and thin-film analysis.
WITec, www.witec.de.
