Asylum AFM module enables electromechanical measurements
-- Test & Measurement World, 12/18/2007 8:32:00 AM
In response to the growing number of applications for electromechanical imaging and spectroscopy, Asylum Research offers the Piezo Force Module, which enables very-high-sensitivity, high-bias, and crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems.
The module, which is available as an accessory for the MFP-3D atomic force microscope (AFM), permits high-voltage piezoresponse force microscopy (PFM) measurements and provides advanced imaging modes for characterizing the sample material. With the Piezo Force Module, a bias is applied to the AFM tip using proprietary electronics, a high-voltage cantilever, and sample holder. The vertical and lateral response amplitude measures the local electromechanical activity of the surface, and the phase of the response yields information on the polarization direction. High probing voltages of up to ±220 V can characterize even very weak piezo materials.
Imaging modes, dual-frequency resonance tracking, and band excitation effectively use resonance enhancement in PFM and provide new information on local response and energy dissipation that cannot be obtained by standard AFM scanning modes. These techniques allow independent measurement of amplitude, resonant frequency, and Q factor of the cantilever and overcome limitations of conventional sinusoidal cantilever excitation.
Asylum Research, www.asylumresearch.com.
