Agilent and Multiprobe bring nanoprober to Asia
-- Test & Measurement World, 12/20/2007 6:00:00 AM
As part of their expanding strategic partnership, Agilent Technologies will sell and support Multiprobe’s Multiscan Atomic Force Prober (AFP) to customers in Asia and Japan. This arrangement strengthens the existing relationship between the two companies and expands Agilent’s product offerings to include failure analysis probing. Multiprobe is already using the Agilent B1500A semiconductor device analyzer in its current products.
The Multiscan AFP lets you quickly and repeatedly probe and characterize the electrical parameters of transistors and other structures at 65 nm and below. It uses multiple, specialized atomic force microscope heads to locate a failing transistor and contact extremely close-spaced terminals. Software allows you to place probes easily to facilitate the debug process.
“At 65 nm and below, semiconductor manufacturers face tremendous challenges in failure analysis, including the probing of extremely small line widths and the measurement of very small voltages and currents,” said Minoru Ebihara, VP and GM of Agilent Hachioji Semiconductor Test Division. “By expanding our relationship with Multiprobe, we are now planning to offer our customers in Asia access to a comprehensive solution available for nanoscale probing for failure analysis.”
Agilent Technologies, www.agilent.com
