Integrated T2000LS/M4841 SOC Test Cell

Advantest , www.advantest.com

Advantest’s Integrated High Performance T2000LS Mainframe/M4841 Dynamic Test Handler SOC Test Cell Solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.

The OpenStar-compliant and liquid-cooled T2000LS is compact yet flexible enough to test various system-on-chip (SOC) devices. Its 26-slot test head accommodates the instrument modules necessary to test RF, audio, baseband, and data-conversion functions; in addition, the T2000LS can support more than 2000 digital pins.

The M4841 handles a range of packages. It employs technological innovations such as Advantest’s Soft Touch handling feature, which uses an electro-pneumatic air-pressure technique to avoid damaging extremely miniaturized parts during touchdown.

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