Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe
Email
Print
Reprint
Learn RSS

Berkeley Nucleonics releases universal LabView driver

-- Test & Measurement World, 1/21/2008 3:00:00 PM

Berkeley Nucleonics Corp. (BNC) offers a complimentary universal LabView driver certified by National Instruments for controlling its entire family of digital delay pulse generators using LabView software versions 8.5 and 8.0.

The functionality of BNC’s Models 505, 565, and 575 digital delay pulse generators offers limitless configuration possibilities for experimental and operational designs. By eliminating the time and effort necessary to define programming combinations, this new flexible approach provides ready-made examples for most common operations. The logical three-tier design enhances the intuitive hierarchy, drag/drop methodology, and protected data spaces. These features allow for the development of custom code quickly and efficiently. The driver communicates via RS-232, GPIB, Ethernet, and USB without any additional code changes.

You can download BNC’s universal LabVIEW driver from National Instruments’ Web site at http://sine.ni.com/apps/utf8/niid_web_display.model_page?p_model_id=5669.

Berkeley Nucleonics, www.berkeleynucleonics.com or www.digitaldelaygenerators.com

Email
Print
Reprint
Learn RSS

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

By This Author

There are no other articles written by this author.

Sponsored Links



 
Advertisement
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Martin Rowe
    Rowe's and Columns

    May, 9 2008
    Upgrades include blood pressure
    Every time I install new or upgraded software on my home computers, I can feel my blood pressure ris...
    More
  • Rick Nelson
    Taking the Measure

    May, 6 2008
    Measurement drives green engineering
    Have we reached peak oil? I guess we know where Paul Rako stands on that question, but other observe...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS
Click on a title below to learn more.

Test Industry News (3 Times Per Month)
Machine-Vision & Inspection (Monthly)
Communications Test (Monthly)
Design, Test & Yield (Monthly)
Automotive, Aerospace & Defense (Monthly)
Instrumentation (Monthly)
Resource Center E-Alert (Monthly)
©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites