JTAG module tests DDR2 Mini DIMM 244 interfaces
-- Test & Measurement World, 2/6/2008 5:44:00 AM
Goepel electronic has announced the introduction of its Module/DIMM244so, a member of the company’s CION product family. The new module is serially controlled via a boundary-scan TAP, and it enables the testing of all signal and voltage supply pins of JEDEC-standard-compliant (JESD79-2C) DDR2 Mini DIMM 244-pin sockets.
“The opportunity to test DDR2 Mini DIMM 244 interfaces was on the top of our customer’s wish list,” said Raj Puri, VP of marketing and sales for Goepel in North America. “These new CION modules provide a cost effective solution for applications in laptops, PCs, and work stations.”
The CION Module/DIMM244so plugs directly into the sockets to be tested. Because the modules are equipped with a transparent TAP, several boards of the same or different types can be cascaded in a daisy-chain configuration. The structural boundary-scan test of all DIMM 244 signal and voltage supply pins are executed by the on-board CION ASIC ICs. All channels can be independently switched as input/output/tristate. Module/DIMM244so provides safety mechanisms to prevent damages in case of shorts or overvoltage conditions.
The new hardware module is supported by Goepel’s ScanBooster and ScanFlex boundary-scan controller families as well the System Cascon integrated boundary scan software platform.
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