Curtiss-Wright employs XJTAG system for PCB testing

-- Test & Measurement World, 3/17/2008 10:07:00 AM

Curtiss-Wright Controls Embedded Computing has chosen XJTAG’s IEEE 1149.1 JTAG-compliant boundary-scan development system to improve the process of debugging and testing its range of radar, video, and graphics products.

The XJTAG system is being used by engineers at Curtiss-Wright’s video and graphics group in Letchworth,UK, to debug and test its latest range of complex printed circuit boards, which employ an increasing number of ball grid array devices, including FPGAs.

Alan McCormick, managing director of Curtiss-Wright’s video and graphics group, said, “We selected the XJTAG system due to its price, the speed and accuracy of fault diagnosis, and because the reusable device-centric test scripts can be ported from project to project and migrate through design, prototyping to production and beyond. Using XJTAG, we can very quickly debug and test both the boundary scan and cluster devices on our boards, many of which are inaccessible with conventional test methods, such as flying probes, logic analyzers, oscilloscopes, and X-ray systems.”

XJTAG CEO Simon Payne stated, “We are delighted that Curtiss-Wright, a renowned name in the aerospace and defense market, has selected the XJTAG system to validate its latest range of PCBs, which will form part of larger solutions and be used throughout the world in vehicle, airborne, and shipborne command and control consoles, vessel tracking, air traffic control, and air defense systems.”

The XJTAG development system enables the debugging, testing, and programming of electronic printed circuit boards and systems throughout the product lifecycle. It reduces the time and cost of board development and prototyping by allowing early test development, early design validation of CAD netlists, fast generation of highly functional tests, and test reuse across circuits using the same devices.

XJTAG, www.xjtag.com and Curtiss-Wright Controls, www.cwcembedded.com.