Nikon, JEOL introduce bench SEM
-- Test & Measurement World, 3/19/2008 1:43:00 PM
Nikon Instruments and JEOL have collaborated on the NeoScope, a new bench scanning electron microscope (SEM) that the companies say fill the optical microscopist's need for advanced imaging capability that is affordable and easy to use. The companies expect the NeoScope will help accelerate research in several fields, including failure analysis of manufacturing materials.
The NeoScope SEM offers 10X to 20,000X magnification without the need for a lens change. Operation is simplifed through auto-focus, auto-contrast, and auto-brightness controls. In addition, the instrument operates in both low- and high-vacuum modes and has three settings for accelerating voltage (15 kV, 10 kV, and 5 kV), all of which can be programmed in stored recipe files. The NeoScope can handle samples of up to 70 mm in diameter and 50 mm thick.
"We’ve found a natural platform where both companies meet," said Peter Genovese, JEOL USA VP and GM of sales in Peabody, MA. "Nikon and JEOL have products that complement one another in the laboratory and research environment. The science of electron microscopy is very closely related to optical microscopy, but the NeoScope SEM extends the depth of field and resolution far beyond the optical microscope."
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www.nikoninstruments.com
