Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe
Email
Print
Reprint
Learn RSS

Pintail teams with Avago to hone adaptive test software

-- Test & Measurement World, 3/25/2008 9:37:00 AM

Pintail Technologies, a supplier of adaptive test software for semiconductor manufacturing, announces that it will incorporate advanced outlier detection algorithms developed by Avago Technologies into its commercial software offerings. Pintail’s SwifTest statistical test software can increase the quality and reliability of tested components by performing dynamic outlier detection and rejection during online production.

“Pintail wants to thank Pete O’Neill of Avago for selecting SwifTest as the most efficient vehicle to deliver his statistical test concepts into volume production,” said Taylor Scanlon, President and CEO of Pintail. “Pete is a recognized leader in this field and has been instrumental in showing us how to expand SwifTest’s capabilities to include a whole new generation of adaptive test techniques.”

Avago has worked closely with Pintail over the past 12 months as Pintail re-architected SwifTest to accommodate more sophisticated and general-purpose sets of data models and program interfaces. Pintail plans to include Avago algorithms in its future SwifTest product offerings. Users will be able to add their own proprietary algorithms to SwifTest for performing online test time reduction or quality improvement. There are over 400 copies of SwifTest in worldwide production today running on a variety of leading testers, including Verigy’s 93K and Teradyne’s FLEX and J750 platforms. In addition, Avago plans to use SwifTest in its production flow.

www.pintail.com

Email
Print
Reprint
Learn RSS

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

There are no other articles written by this author.

Sponsored Links



 
Advertisement
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Rick Nelson
    Taking the Measure

    August 19, 2008
    Nvidia’s GPU quality issues
    What should Nvidia do about suspect graphics processing units, which might fail because of a potenti...
    More
  • Rick Nelson
    Taking the Measure

    August 14, 2008
    Diamond advances amid merger process
    Credence and LTX executives remain mum on long-term plans to rationalize product lines in light of t...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS
Click on a title below to learn more.

Test Industry News (3 Times Per Month)
Machine-Vision & Inspection (Monthly)
Communications Test (Monthly)
Design, Test & Yield (Monthly)
Automotive, Aerospace & Defense (Monthly)
Instrumentation (Monthly)
Resource Center E-Alert (Monthly)
©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites