Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe
Email
Print
Reprint
Learn RSS

TUV SUD America receives CB scope extension

-- Test & Measurement World, 4/1/2008 3:08:00 PM

Testing and certification services provider TUV SUD America has been granted a scope extension for its Danvers, MA, laboratory after reassessment by the International Electrotechnical Commission of Electrical Engineers (IECEE), the arm of the IEC charged with implementing a worldwide system for conformity testing and certification of electrical equipment and components. This extension adds to the available list of IEC standards for which TUV currently has accreditation, increasing the number to 25 available standards.

The IECEE CB Scheme is a multilateral certification system based on standards by the IEC. Having products tested and approved to IEC international standards makes international trade easier and more cost-effective.

The new CB scope extension gives TUV continued testing capabilities in the information technology and office equipment category, plus additional testing capabilities in the electrical medical equipment, household appliance, measuring instrument, and entertainment electronics categories.

In addition to the CB scope extension, TUV’s Brighton, MN, facility joined the IECEE CB Scheme as an Associated CB Testing Laboratory (ACTL), offering the office equipment scope, which includes testing to IEC 60950-1 (1Ed) and IEC 60950-1 (2Ed) standards.

"I am very pleased that we can now offer a much broader scope of CB certificates," stated Joe Janeliunas, Senior Compliance Manager for TÜV SÜD America. "CB work is important for our customers because it allows them to market their product in most parts of the world. TUV SUD America is acting as an agency that provides access to Europe, the US, Canada, South America, and Asia," concluded Janeliunas.

www.tuvamerica.com.

Email
Print
Reprint
Learn RSS

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

There are no other articles written by this author.

Sponsored Links



 
Advertisement
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Rick Nelson
    Taking the Measure

    July 1, 2008
    S-parameters are so yesterday
    Textbook amplifiers operate in linear mode and are easy to analyze. Unfortunately, it’s often ...
    More
  • Martin Rowe
    Rowe's and Columns

    May 28, 2008
    More on Bill and Dave
    In my January 11 posting, "Tell your Bill and Dave Stories," I asked if the HP Way still e...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS
Click on a title below to learn more.

Test Industry News (3 Times Per Month)
Machine-Vision & Inspection (Monthly)
Communications Test (Monthly)
Design, Test & Yield (Monthly)
Automotive, Aerospace & Defense (Monthly)
Instrumentation (Monthly)
Resource Center E-Alert (Monthly)
©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites