Pintail announces expanded adaptive-test software
-- Test & Measurement World, 5/5/2008 1:32:00 PM
Pintail Technologies, a supplier of adaptive-test software for semiconductor manufacturing, has announced the release of a new generation of products for its SwifTest platform. The new SwifTest products offer users the ability to dynamically optimize test time and test coverage, improve device quality and reliability, and actively monitor and improve device yield during production testing at both wafer probe and final (packaged) test.
A major enhancement included in all of the new SwifTest products is the ability for users to add their own algorithms via a simple Java-based interface. The new products also run four to five times faster and require 25% less memory than earlier SwifTest products, the company reports.
The five new products are as follows:
• SwifTest-AMX (Advanced Monitoring Executive) captures data in real-time from automated test equipment (ATE) and makes it available to upstream database systems or to the adaptive test modules described below. In addition to traditional STDF, SwifTest-AMX can now be programmed to accept any format of test data.
• SwifTest-FOX (Fast Outlier Extraction) includes advanced dynamic outlier detection algorithms for improving device reliability at both probe and final test. Users can also reduce their burn-in costs using this software. Many of the algorithms are provided under license from Avago Technologies. Outlier detection may be used within a single device under test (DUT) or across an entire wafer or lot.
• SwifTest-TTO (Test Time Optimization) performs real-time, statistical test-flow optimization to reduce cost of test. It adaptively increases or decreases test coverage based upon the monitored quality and yield of the device. TTO can be used for both parametric tests and functional patterns and may be used at both probe and final test.
• SwifTest-DTI (Dynamic Test Interface) is used to support a variety of miscellaneous adaptive-test algorithms. Examples include Pintail’s new Dynamic Site-site Calibration (DSC), which can automatically correct certain forms of site-site variation on-the-fly and thus recover yield losses at test.
• SwifTest-MAX (Monitoring Actions) provides programmable, real-time triggers and trigger actions that can support sophisticated monitoring strategies based upon multiple bin counters, cumulative bin counters, windowed probabilities, and wafer zones.
“Over 500 copies of SwifTest are in production worldwide today and over 1 billion devices have been shipped by our customers using the SwifTest adaptive test platform,” stated Taylor Scanlon, president and CEO of Pintail. “The introduction of these new products further extends our lead in adaptive test.”
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