T&MW's Top Articles for April 2008

-- Test & Measurement World, 5/15/2008 9:35:00 AM

Top Print Articles

Putting teamwork on the radar
Test Engineer of the Year Hung Nguyen drives F/A-18 AESA radar-system test and integration at Raytheon. Read More

How does a Smith chart work?
The Smith chart appeared in 1939 as a graph-based method of simplifying the complex math (that is, calculations involving variables of the form x + jy) needed to describe the characteristics of microwave components. Read More

MIMO challenges existing ATE
Before MIMO technology can become widely accepted, it will have to cost about the same as current wireless technology. This dictates that test-system manufacturers rein in test costs by developing automatic test equipment that can handle MIMO devices during high-volume production. Read More

Design for dust
Just because you work in an air-conditioned office or a temperature-controlled lab doesn’t mean your equipment won’t suffer from indoor air pollution. You can guard against the negative effects of airborne pollution such as dust and moisture by designing products to meet insulation requirements. 
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Odds and ends: LEDs, waveguides, data acquisition
Brad Thompson comments on the recent trend toward blue LEDs, suggests a way to avoid bloodied knuckles, and describes an alternative data-acquisition and control software called EZGPIB. 
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Guest Commentary: Metrology personnel shortage is real
With the US facing a shortfall of technical professionals, concerned individuals and professional metrology organizations are taking steps to increase metrology awareness with an emphasis on education and training. Read More

Guest Commentary: Should you migrate test applications to Windows Vista?
A new security structure, virtualization, and a 64-bit version will raise compatibility issues should you migrate your test application. Read More

Don't overspecify machine-vision cameras
Bruce Butkus of Edmund Optics recommends that you concentrate on the type of camera and lens you actually need rather than adding unnecessary "fudge factors" to your specifications. Read More

Acquiring data during flight test
Dr. Patrick Walter, a professor of engineering at Texas Christian University and the senior measurement specialist at PCB Piezotronics, recently described some of the challenges involved with collecting data during flight test. Read More

Engineers to be supplanted by domain experts?

Asset, Verigy go holiday shopping

Test engineers should vote to save Windows XP

Evaluating printed-circuit-board test options

The trifecta that almost everyone loses