TI's 16-bit ADCs reach 80 Msamples/s with high SNR
-- Test & Measurement World, 5/29/2008 12:00:00 PM
Texas Instruments’ family of 16-bit, single-channel analog-to-digital converters provides sampling rates of up to 80 Msamples/s, along with a high signal-to-noise ratio (SNR) for input frequencies within the first Nyquist zone, while consuming very little power. The converters’ low noise floor improves accuracy in test and measurement tasks, receiver sensitivity in wireless communications, and image quality in medical, industrial, and military applications.
According to TI, the ADS5562 offers 6 dB greater SNR and 0.6 more effective bits than any other 80-Msample/s device consuming less than 900 mW of power. The ADS5562 also provides dynamic power scaling, reducing power consumption to as little as 540 mW at 25 Msamples/s.
Both the 80-Msample/s ADS5562 and 40-Msample/s ADS5560 include an array of other digital features for added flexibility. To further reduce noise, the devices offer a low-frequency noise suppression mode to eliminate 1/f (flicker) noise, improving SNR by up to 4.2 dB over a 1-MHz band in baseband and time-domain applications. In addition, programmable gain from 0 dB to 6 dB allows full-scale outputs to be provided for input signals as low as 2 V pk-pk. You can also choose between parallel CMOS or fully differential double data rate LVDS outputs, which can enable up to 2 dB additional SNR performance.
The ADS5562 and ADS5560 come in 7x7-mm, 48-pin QFN packages and cost $48.33 and $35, respectively (1000 units).
Texas Instruments, www.ti.com.
