Global TMW:
Log In  |  Register          Free Newsletter Subscription
Subscribe

Improve thermal cycling time

Martin Rowe, Senior Technical Editor -- Test & Measurement World, 6/1/2008

Thermal cycling tests can help you improve the reliability of electronic components, subsystems, and systems, but ensuring all areas of a product get tested at the correct temperature can be tricky. Electronic products consist of numerous materials, and each material has unique thermal characteristics. To ensure that you achieve the desired temperature at a given location, you should attach a thermocouple or other probe and monitor the temperature at the point of interest.



Product temperature (red trace) rises exponentially in response to step changes in thermal-chamber temperature (blue trace).

During your tests, keep in mind that chamber temperatures change nonlinearly and temperatures of materials used in products change exponentially. The figure shows material temperature (red trace) and chamber temperature (blue trace) as a function of time. Changes start out fairly linear but then roll off as the material temperature approaches the chamber temperature. After three thermal time constants of a material, it will have reached 95% of the chamber's temperature. It will reach 99% after five thermal time constants.

Because of the roll-off in temperature change, getting a product to reach the desired temperature at a location inside the product can take some time. To reduce cycle time, you can set a chamber's temperature above or below the desired product temperature. Doing so will keep thermal changes in the more linear portion of the cycle.

To learn more about thermal cycling and how to set chamber temperatures, you can download “Thermal cycling: Keep it linear,” a paper by Mark Woolley, Jessica Greco, Wes Brown, and Dr. Jae Choi of Avaya Product Technology and Reliability Laboratory.

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

Reed Business Information Resource Center

Featured Company


Most Recent Resources


Sponsored Links



 
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Rick Nelson
    Taking the Measure

    June 15, 2009
    Design and test highlights at the microwave show
    I attended the IEEE MTT-S International Microwave Symposium last week, where I saw a variety of desi...
    More
  • Rick Nelson
    Taking the Measure

    May 28, 2009
    Rick’s Short Circuit: tech news from around the Web
    Tech news today focuses on iPhone ups and downs, Android and digital washing machines, solar cop car...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS

Test Industry News
Automotive, Aerospace, & Defense
Communications Test
Design, Test & Yield
Machine-Vision & Inspection
Instrumentation
Please read our Privacy Policy
©2009 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites