SV Probe launches memory and logic probe cards

-- Test & Measurement World, 7/14/2008 9:01:00 AM

SureTouch, a single-touchdown memory probe card, and LogicTouch, a fine-pitch vertical probe card, aim to provide superior testing performance at a lower cost of ownership, according to manufacturer SV Probe. Probe cards are essential tools in the electrical testing of semiconductor wafers before they are diced, packaged, and assembled in electronic products, such as mobile phones, computers, and digital media players. Kevin Kurtz, President and CEO of SV, said, "Over the next few years, we believe the key emphasis for probe card products will be on cost/performance benefits that are driven by high parallelism and fine-pitch probing capabilities."

Targeting NAND flash memory, SureTouch enables testing of all devices on the wafer with just one contact between the probe card and the wafer, instead of multiple step contacts as with other conventional test products. It is positioned to address the demand for high parallelism testing, short manufacturing lead times, and lower cost of ownership for NAND flash memory.

LogicTouch is a MEMS-based fine-pitch vertical probe card for advanced mixed-signal and logic devices, such as microprocessors, digital signal processors, and system-on-chip ICs that require high parallelism testing and device adjacent pad pitch of 60 microns and below. MEMS-based cards use photolithographic technology in the fabrication of critical probe card components, such as probe pins. It allows probe card manufacturers to meet the challenges of shrinking chip pad geometries, higher pad density, and testing parallelism. 

SV Probe, www.svprobe.com.