Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe
Email
Print
Reprint
Learn RSS

Highlights

-- Test & Measurement World, 8/1/2008

JAI expands GigE Vision camera suite

JAI has added the BM-500GE (monochrome) and BB-500GE (raw Bayer color) 5-Mpixel cameras with a GigE Vision interface to the Basic tier of its C3 Camera Suite. The cameras are built around the Sony ICX625 2/3-in. CCD sensor (2448x2050 pixels) and can operate at 15 fps.

A Sequence Trigger Mode allows the user to predefine on-the-fly changes to gain, shutter, and the region-of-interest (ROI) settings for a repeating sequence of up to 10 consecutive triggers. JAI says this capability is useful on production lines where items being inspected might require different settings for different regions of the object, or where different settings are needed to properly inspect for different types of defects within the same ROI. www.jai.com.

FEI introduces high-resolution SEMs

With the release of its Magellan Family, FEI has introduced what it calls a new class of instruments: extreme high-resolution scanning electron microscopes (XHR SEMs). The Magellan XHR SEM allows engineers to see 3-D surface images at many different angles and at resolutions below 1 nm. The system images samples at very low beam energies, avoiding distortions caused by a beam penetrating into the material below.

The Magellan Family comes in two models: The Magellan 400 for scientific research and the Magellan 400L for semiconductor labs. The 400L, which allows manufacturers to see critical details on complex 3-D structures in 32-nm nodes and below, comes with a load-lock feature that speeds up throughput, and it includes a retractable solid-state backscatter electron detector. www.fei.com.

PPT Vision upgrades camera line

Available in both monochrome and color models, the upgraded Impact T3X intelligent cameras from PPT Vision offer pixel resolutions ranging from 640x480 to 1600x1200 as well as onboard image processing, real-time I/O, and 128 Mbytes of onboard memory. The Impact Vision Program Manager, which is part of the bundled software suite, offers more than 120 tools, including optical character recognition, blob analysis, circular pattern find, line find, and subpixel gauging. The cameras also offer discrete I/O, serial, Ethernet/IP, TCP/IP, HTTP, Modbus, and ActiveX communication protocols. www.pptvision.com.

Rudolph sells lead-scanner line

Rudolph Technologies reports that it has sold its lead-scanner assets, which the company acquired from RVSI Inspection in January, to BKM Technology Partners. The transfer of assets and inventory is expected to be completed during the third quarter of 2008. The lead scanners can be used to perform final inspection for semiconductor devices such as ball-grid arrays and quad flat packs.

“We are excited about adding the lead scanner to our semiconductor solutions portfolio,” said Barton A. Katz, BKM partner. “BKM is committed to providing world-class support. Following a seamless transition of this business from Rudolph to our organization, we intend to deliver this same level of support for lead-scanner customers. BKM has previously supported the RVSI Lead Scanner product line in North America, so it makes sense to expand this expertise worldwide.” www.bkmtechnologypartners.com; www.rudolphtech.com.

Email
Print
Reprint
Learn RSS

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

There are no other articles written by this author.

Sponsored Links



 
Advertisement
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Martin Rowe
    Rowe's and Columns

    November 5, 2008
    Technical articles retain value
    I'm always amazed, and pleased, when I hear from readers who still find value in old T&MW articl...
    More
  • Martin Rowe
    Rowe's and Columns

    October 31, 2008
    Measurement proverbs
    The other day, I received some measurement proverbs that I'd like to share. The proverbs come from K...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS
Click on a title below to learn more.

Test Industry News (3 Times Per Month)
Machine-Vision & Inspection (Monthly)
Communications Test (Monthly)
Design, Test & Yield (Monthly)
Automotive, Aerospace & Defense (Monthly)
Instrumentation (Monthly)
Resource Center E-Alert (Monthly)
©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites