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Dynamic range unraveled

Characteristics such as noise and distortion interact to affect the dynamic range of a spectrum analyzer.

By Satish Dhanasekaran and Darrin Russell, Agilent Technologies -- Test & Measurement World, 8/1/2008



A version of this article previously appeared in the 
May 29, 2008, issue of EDN.

To provide the increased bandwidth and data-transmission rates necessary for wireless data, voice, music, and video applications, engineers must contend with higher-order modulation schemes that place stringent demands on spectrum analyzers, particularly on their dynamic range. Defined as the difference between the highest and lowest power signals that a spectrum analyzer can simultaneously measure, an instrument’s dynamic range impacts measurements such as adjacent channel response and spurious response.

A spectrum analyzer’s distortion and noise floor directly affect its dynamic range. Understanding the measurements you need to make for a given application can help you evaluate whether an analyzer’s dynamic range is adequate and may prevent you from buying a more expensive analyzer than you need.



Figure 1.  An RF transmitter’s function blocks have different performance specifications.

Dynamic range plays a vital role in measurements on wireless transmitters (Figure 1). Air-interface standards and regulatory bodies such as the FCC specify the performance requirements for transmitters and provide guidelines for spectral purity that cover spectral emissions and adjacent-channel power ratio (ACPR).

Table 1 gives an example of transmitter specifications at the block outputs in Figure 1. Typically, the signal at the output of the digital-to-analog converter (DAC) has the tightest spectral performance requirements.



Figure 2.  DANL, SHI, TOI, and noise limit a spectrum analyzer’s dynamic range.

Spectrum-analyzer specifications that affect dynamic range include third-order intercept (TOI), second-order harmonic intercept (SHI), and displayed average noise level (DANL). The dynamic-range chart (Figure 2) shows these parameters versus a spectrum analyzer’s mixer levels. As the mixer level increases, DANL decreases toward the instrument’s phase-noise level, which is the same point where TOI emerges above the phase noise.



Figure 3.  Active components such as mixers add harmonic distortion to a received signal.

The SHI and TOI of a spectrum analyzer’s mixer (Figure 3) greatly affect the instrument’s distortion. The mixer input level (in decibels referred to 1 mW, or dBm) is the difference between the input signal applied to the analyzer and the RF input attenuation level (also in dBm).

For measurements at RF and microwave frequencies, the third-order and fifth-order intermodulation products of active components such as mixers and amplifiers dominate the instrument’s ACPR measurements. For an ACPR measurement to reflect the true performance of the transmitter under test, the analyzer’s distortion must be significantly lower than that of the transmitter. If the spectrum analyzer’s distortion level is 18 dB below that of the device under test, the measurement uncertainty will be less than 1 dB (Ref. 1).

The TOI slope in Figure 2 shows that for every 1 dB that you reduce the mixer’s input signal level, you reduce the TOI distortion products by 2 dB. You can achieve even lower levels at the mixer’s input by increasing the analyzer’s input-signal attenuation. Increasing the attenuation, however, directly impacts the noise floor and reduces the dynamic range. Optimal attenuator settings, therefore, involve a tradeoff between TOI and noise-floor performance.

Two tones

You can use two-tone analysis as a starting point to better understand a spectrum analyzer’s performance, because you can represent wide-bandwidth signals as a summation of tones (Figure 4). Third-order intermodulation products drop in amplitude to the instrument’s noise floor from the center of the carrier to the edge of the adjacent channel.



Figure 4.  Third-order and fifth-order distortion decreases as the frequency offset from the carrier increases.

Although lower in amplitude, fifth-order distortion products don’t reach the noise floor until twice the main channel’s bandwidth (alternate channel). Even harmonics fall outside the area of interest and thus don’t appear in Figure 4.

DANL—a measure of a spectrum analyzer’s sensitivity—also affects dynamic range and is typically specified at 0-dB input attenuation and normalized to a 1-Hz resolution bandwidth (dBm/Hz). Spectrum-analyzer noise forces an increase in DANL as the mixer level drops in response to greater attenuation of the signal in front of the mixer.

Using Figure 2, you can find the optimal mixer input level and, with it, the level of input attenuation. The intersection of the TOI and noise-floor lines provides the optimal mixer input level for maximizing dynamic range at about –38 dBm. Figure 4 highlights this intersection and shows the areas where phase noise, TOI, and broadband noise dominate dynamic range.

To further improve dynamic range, some spectrum analyzers apply averaging and trace math to subtract the analyzer’s noise from the measurement. Noise correction can provide up to a 10-dB improvement in noise-floor performance. Noise correction also lets you apply additional attenuation to drive the internal TOI of the analyzer down without increasing the noise floor (for TOI-limited measurements).

Problems with phase noise

The phase noise of an analyzer’s local oscillator can also degrade noise-floor performance at offset frequencies close to the carrier. At offsets greater than 1 MHz from a carrier, the phase noise won’t impact dynamic range.



Figure 5.  At offset frequencies from a channel, different parameters dominate dynamic range.

As an example, assume you have a digitally modulated signal with a main channel bandwidth of 10 MHz (5 MHz from the channel's center frequency) and that you need to measure the spectral emissions at an offset of 5.1 MHz in a 100-kHz integration bandwidth. The 5.1-MHz offset represents a 100-kHz offset from the edge of the main channel. At that offset, the analyzer’s phase noise will now be a contributing factor (Figure 5). Thus, for measurements close to a channel’s bandwidth, the analyzer’s dynamic range is limited to 65 dB. At offsets further away (say greater than 1 MHz), the phase noise of the analyzer improves and does not represent a limitation for dynamic range.

Resolution bandwidth (RBW) also affects a spectrum analyzer’s noise floor. When you increase resolution bandwidth, you increase the noise floor by (10*log(RBW2/RBW1)), but you shorten sweep time. So, you can trade off dynamic range for shorter measurement time.

SHI, TOI, DANL, and resolution bandwidth combine to form a spectrum analyzer’s dynamic range. By optimizing the combination of these specifications, you’ll find the optimum point of the instrument’s dynamic range.


Table 1. Performance specifications at internal blocks of a transmitter

Specification

Digital/analog output

Small-signal transmitter output

Power amplifier output

System output

Power level (dBm at 10-MHz bandwidth)

–10            

20              

34          

33       

7-MHz offset

–71            

–68              

–61          

–58       

25-MHz offset

–83            

–80              

–73          

–70       



Author Information
Satish Dhanasekaran has an MSEE from Florida State University and currently works as a wireless application specialist with Agilent Technologies. He has more than 8 years of experience in the RF/wireless industry.
Darrin Russell, a wireless application specialist with Agilent Technologies, has a BSEE from the University of Texas at Arlington. He has more than 10 years of experience in the RF/wireless industry.


Reference
  1. “Optimizing Dynamic Range for Distortion Measurements,” Product Note, literature number 5980-3079EN, Agilent Technologies, 2000. cp.literature.agilent.com/litweb/pdf/5980-3079EN.pdf.
For more information
“8 Hints for Better Spectrum Analysis,” Application Note 1286-1, Agilent Technologies, 2005. cp.literature.agilent.com/litweb/pdf/5965-7009E.pdf.
“Spectrum Analysis: Noise Measurements,” Application Note 150-4, Agilent Technologies, 1989. cp.literature.agilent.com/litweb/pdf/5952-1147.pdf.
“Agilent Spectrum Analyzer Measurements and Noise,” Application Note 1303, Agilent Technologies, 1998. cp.literature.agilent.com/litweb/pdf/5966-4008E.pdf.

A version of this article previously appeared in the May 29, 2008, issue of EDN, www.edn.com.
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