Probe cards target memory, logic
-- Test & Measurement World, 8/1/2008
SV Probe recently announced two new probe cards for semiconductor wafer test. Targeting NAND flash memory, the SureTouch single-touchdown memory probe card enables testing of all devices on a wafer with just one contact between the probe card and the wafer. It is positioned to address the demand for high parallelism testing, short manufacturing lead times, and lower cost of ownership for NAND flash memory. The MEMS-based LogicTouch, a fine-pitch vertical probe card, is designed for advanced mixed-signal and logic devices, such as microprocessors, digital signal processors, and system-on-chip ICs that require high parallelism testing and device adjacent pad pitch of 60 microns and below.
SV Probe, www.svprobe.com.
