Credence debuts Diamond V/I instrument
-- Test & Measurement World, 8/14/2008 5:07:00 AM
Credence Systems has unveiled the latest addition to its family of instruments for the Diamond test platform. The 72-channel HDVI (high density voltage/current) instrument is targeted at reducing the cost of test by enabling large numbers of sites to be tested in parallel. The HDVI instrument’s high-precision source and measurement capability is targeted at the test of microcontrollers as well as audio, video, wireless cellular, digital camera, base-band, and power-management devices used in a broad range of cost-sensitive applications. The targeted applications are in keeping with a strategy outlined by Lavi Lev, Credence's president and CEO, in January. (See related commentary, “Diamond advances amid merger process.”)
The V/I channel count of the HDVIþuup to 432 channels on the Diamond 10 and up to 1728 channels on the Diamond 40þuresults in cost-per-channel as low as $1500. It also helps to free up more instrument slots in the tester, thereby enabling larger multisite configurations. When combined with the Diamond platform’s other high-density instruments, HDVI increases the capacity of each test system and consequently reduces the number of test cells needed on the production floor. At the same time, throughput is dramatically increased by the high degree of parallel test capability.
“Our customers continue to face intense price pressures, which is driving higher-count multisite testing for cost of test and throughput improvements. SOC/SIP devices are also growing more complex through increasing integration of features, placing greater pin-count and test coverage demands on ATE," stated Amir Aghdaei, senior VP of field operations and marketing at Credence, in a prepared statement. "Clearly, acquisition costs and operational efficiency of the test system have become especially critical. With the addition of the HDVI instrument, the Diamond platform can cost-effectively test higher site counts without additional capex demand, helping our customers to stay on top of rising demand and falling ASPs and thus meet profitability goals.”
The HDVI instrument enables efficient use of test-head resources (slots) via a range of functionality and features that traditionally required multiple V/I options on other platforms. The HDVI contains 72 channels that can be operated in one of two modes: voltage/current supply (VIS) and precision analog source (PAS). The VIS mode offers 72 channels of general-purpose, four-quadrant V/I capability for up to +/-7 V and a maximum of +/-2 A. In the PAS mode, each channel can source user-defined analog waveforms with high accuracy for driving analog inputs of microcontrollers and embedded ADCs to perform INL and DNL tests.
Other features include a built-in, high-bandwidth input matrix that allows external instruments to connect to multi-use DUT pins and eliminate load-board components. A trigger control for source and measure memory synchronizes operation with tester or DUT events. Measurement accuracy is better than +/-0.9 mV and +/-80 nA.
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