Global TMW:
Login  |  Register          Free Newsletter Subscription
Subscribe
Email
Print
Reprint
Learn RSS

Diamond advances amid merger process

Rick Nelson, Editor in Chief -- Test & Measurement World, 9/1/2008

E-mail

Credence and LTX executives remain mum on long-term plans to rationalize product lines in light of the two firms’ plan to merge, but on the Credence side, development continues apace on instrumentation for the Diamond platform. The latest entry is the 72-channel HDVI (high-density voltage/current) instrument, which is targeted at reducing the cost of test by enabling large numbers of sites to be tested in parallel.

In a phone interview with Arun Kancharla, product marketing manager at Credence, and Thomas Vana, marketing director for the Diamond platform, Kancharla said that the new instrument—and in fact the entire Diamond platform—targets high-volume consumer-electronics devices such as microcontrollers, programmable logic devices (PLDs), FPGAs, gate arrays, DSPs, and embedded controllers used in audio, video, wireless-cellular, digital-camera, baseband, and power-management applications. That’s in keeping with a Credence focus on low-cost test for small- to moderate-scale chips that was described by Lavi Lev, Credence’s president and CEO, in January.



The 72-channel HDVI instrument targets high-volume consumer-electronics devices such as microcontrollers, PLDs, FPGAs, gate arrays, DSPs, and embedded controllers. Courtesy of Credence Systems.

One might infer a bright future for the Diamond platform despite the inability of Credence and LTX to state a long-term product rationalization plan at this point in the merger process. Vana said the Diamond has “stickiness”—as 250 of the platforms are installed worldwide; double-digit growth in device volumes suggest additional opportunities for Diamond adoption. Vana added that customers deploy the low-cost systems to keep test costs down so they can remain profitable as average selling prices of consumer chips fall. With Diamonds having a base price of $60,000, Vana said, customers can deploy them in their labs for code development as well as on the factory floor.

Vana said a customer can unpack a Diamond, plug it in, and be up and running in 10 minutes. Kancharla added that the new HDVI increases the flexibility of already-deployed Diamonds—replacing four 16-channel instruments with a 72-channel HDVI frees up three slots for other instruments. In total, the HDVI permits up to 432 V/I channels on the Diamond 10 and up to 1728 V/I channels on the Diamond 40—at a price, Vana said, of as low as $1500 per channel. As to how many V/I channels a customer might actually need, Vana said that one customer was evaluating a 1200-channel system for massively parallel test at wafer probe. Kancharla commented that another customer deployed a high-channel-count Diamond to implement a 100-site strip test, reducing test costs by 40%.

In addition, he said, a customer reduced capital costs by 30% by deploying the Diamond platform in an eight-site production test program for large GPS baseband processors; another cut capital costs by 40% in a 16-site Bluetooth device test program.

As for the future of expensive big-iron ATE, Vana said he has seen a customer bring up chips on a high-end tester but transfer the test job to Diamond platforms. As for the future of the LTX and Credence platforms, Vana would only say that while the merger goes forward, customers still need to reduce their cost of test.

 

Goepel debuts PXI boundary-scan controllers
Goepel electronic has introduced a series of PXI-based controllers for its ScanFlex boundary-scan hardware platform. The new SFX/PXI1149/C4-FXT controllers incorporate the normally external ScanFlex TAP transceivers into the single-slot, 3U-high unit. The transceivers link to external TAP interface cards (TIC), which can be located within a test fixture or environmental test chamber. The new controllers each offer four parallel TAPs and are available in three performance classes offering TCK frequencies of 20, 50, and 80 MHz. www.goepel.com.


Hana Micron buys Verigy Port Scale RF

Verigy has announced that Hana Micron, a Korea-based company specializing in the assembly and test of semiconductor packages and modules, has selected the Verigy Port Scale RF instrument for testing its IDM and fabless customers’ consumer wireless devices. The Port Scale RF will complement the MB AV8 multiband audio-video cards in Verigy small-test-head systems to test devices targeting applications such as UWB, WiMAX, and mobile TV. www.hanamicron.co.kr; www.verigy.com.


Hynix chooses Teradyne for image-sensor test

Teradyne has announced the introduction of its IP750Ex, an extension of the company’s J750 platform designed specifically to test image sensors featuring up to 32M pixels. Teradyne also announced that Hynix Semiconductor has chosen the new IP750Ex for the production test of its first CMOS image sensor. www.hynix.com; www.teradyne.com.

Email
Print
Reprint
Learn RSS

Talkback

We would love your feedback!

Post a comment

» VIEW ALL TALKBACK THREADS

Related Content

Related Content

 

By This Author

Sponsored Links



 
Advertisement
SPONSORED LINKS

More Content

  • Blogs
  • Podcasts

Blogs

  • Martin Rowe
    Rowe's and Columns

    November 5, 2008
    Technical articles retain value
    I'm always amazed, and pleased, when I hear from readers who still find value in old T&MW articl...
    More
  • Rick Nelson
    Taking the Measure

    October 30, 2008
    ITC: ATE companies team with chip makers, OSAT
    Driven by economic forces, five ATE makers came together yesterday under the CAST banner in an effor...
    More
  • » VIEW ALL BLOGS RSS

Podcasts

Advertisements





NEWSLETTERS
Click on a title below to learn more.

Test Industry News (3 Times Per Month)
Machine-Vision & Inspection (Monthly)
Communications Test (Monthly)
Design, Test & Yield (Monthly)
Automotive, Aerospace & Defense (Monthly)
Instrumentation (Monthly)
Resource Center E-Alert (Monthly)
©2008 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy
Please visit these other Reed Business sites