Seica teams with Corelis for integrated test system
-- Test & Measurement World, 9/2/2008 10:13:00 AM
Aimed at supporting a wide variety of different configurations and applications, Seica has partnered with Corelis to deliver and support an integrated test system based on Seica’s Pilot flying probe system and Corelis’ ScanExpress boundary-scan JTAG test tools. An integrated system has already been successfully deployed at a major defense electronics manufacturer.
“Integrating our ScanExpress boundary-scan and functional test system with the Pilot flying probe tester was an important step for us,” said George B. La Fever, CEO of Corelis. “By combining two separate highly effective and low-cost test solutions, we create a best-of-both-worlds situation. We are looking forward to helping our customers reduce their overall test cost, while improving test coverage.”
David Sigillo, GM of Seice, stated, “This demonstrates the fundamental flexibility of our test systems and our ability to deliver a solution that suits a range of customer needs. Because of the common software platform of our in-circuit test and flying probe systems and the ease of integrating Corelis JTAG hardware and software, we are now able to offer this integrated solution to virtually all of our customers.”
Seica, www.seica.com and Corelis, www.corelis.com.
