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RF modules pose tough test challenges

Engineers at EPCOS employ multiport vector network analyzers to test multifunction miniature front-end modules that support multiple wireless communications standards.

By Rick Nelson, Editor-in-Chief -- Test & Measurement World, 10/1/2008

Sidebars:
University ties boost network-analyzer developments
The evolution of EPCOS



MUNICH, GERMANY
—The proliferation of wireless communications devices is creating a voracious demand for the RF components and modules that make those devices work. The components must, of course, be small enough to fit comfortably within the mobile wireless consumer products they populate and not crowd out ancillary functions like MP3 players and digital cameras. And because consumer products increasingly support multiple communications standards, the miniature devices themselves must incorporate the functionality necessary to implement WiFi, WiMAX, Bluetooth, GPS, DVB-H, UWB, and the various multiband cellular technologies.

On the digital side, Moore’s Law has enabled vendors to make great strides in providing increased functionality within a single CMOS integrated circuit. Radios, however, require numerous other active and passive components as well as baseband digital chips, power amplifiers, switches, and low-noise amplifiers. Discrete passive components don’t follow Moore’s Law and are not amenable to continual miniaturization. Christian Block, VP and CTO of the SAW division at EPCOS (see “The Evolution of EPCOS") described the problem—and the solution—in a 2004 interview (Ref. 1). “Major progress can no longer be made by continuing to miniaturize discrete passive components alone,” he said. “So we are opting for passive integration based on LTCC technology.”

LTCC drives miniaturization

“LTCC” refers to low-temperature co-fired ceramic technology, which EPCOS uses to create multilayer ceramic substrates that embed passive components. Compared with the FR4 material or laminates, LTCC substrates provide lower loss and allow for the integration of many passive components in a compact space (Ref. 2).


Patric Heide prepares automated measurements of LTCC front-end modules for WiMax and WiFi
applications. He said that the
testing of such modules involves
a small-signal test of the many
embedded filter functions as well as the comprehensive large-signal characterization of the modules’ power amplifiers. 
Photo by Carsten Lerp / NPN Worldwide.
An LTCC module, said Dr. Patric Heide, director of product development for modules at EPCOS, might have anywhere from 10 to 20 layers, with each layer between 30 and 50 microns thick. Within those layers, EPCOS can build inductors and capacitors to implement filter functions and baluns. Dr. Heide explained that to help the drive toward miniaturization, the modules also accommodate semiconductor chips such as power amplifiers and switches typically fabricated in GaAs technology. “We’ve developed a lot of knowledge here of how to integrate these active GaAs devices with LTCC structures, and we’ve leveraged our experience in flip-chip and wire-bonding in order to achieve high manufacturing yields in mass production,” he said.

The result of the high levels of integration, he continued, is that “we ship to our customers a fully tested RF system in a single package. In a mobile phone, you have the CMOS-based radio IC built in on one side, and on the other side you have the antenna. We provide a fully featured front-end module that goes between the two.”

An example is a compact all-in-one front-end module for Bluetooth and IEEE 802.11b/g/n WLAN applications, introduced in January. The module integrates a WLAN power amplifier, a WLAN/Bluetooth switch, and a receive balun as well as bias circuitry and ESD (electrostatic discharge) protection for all RF and DC ports, yet it offers an insertion height of only 1.4 mm and occupies a footprint of only 4.5x3.2 mm² on a circuit board. Designated the D6101, it also includes a coexistence filter that allows simultaneous operation of WLAN and Bluetooth applications with all worldwide cellular standards.

Multiport test challenges


Jörg Schuler says that the drive toward miniaturization and high levels of integration results in a package with multiple RF ports that presents tough test challenges. Photo by Carsten Lerp / NPN Worldwide.
During my visit to EPCOS headquarters, Dr. Heide and his colleagues outlined the particular challenges they face in testing such modules. Dr. Jörg Schuler, who is responsible for manufacturing engineering and testing strategies at the EPCOS SAW division, discussed the complexity of the tests needed for miniaturized, highly integrated packages with multiple RF ports: “For a GSM-quad-band WCDMA-triple-band module you have to test four GSM balanced ports, two Tx ports, three wideband CDMA ports, and one antenna. You need to test 14 ports altogether at final testing.” (Each of the balanced GSM ports includes a balun that presents two ports to a test system). He said that important specifications include high dynamic range and good stop-band performance, “so your test system needs to provide as low loss as possible.”

Early test systems employed by EPCOS, Dr. Schuler said, included a two-port VNA (vector network analyzer) and 12-port matrix. He added that EPCOS had early discussions with Rohde & Schwarz about test-equipment needs (see “University ties boost network-analyzer developments”). The discussions ultimately led to today’s use of an eight-port R&S ZVT VNA, which supports test coverage up to 20 GHz, combined with a 10-port matrix. The combination, he said, results in fewer switches connected to the unit under test, thereby minimizing loss, increasing dynamic range, and providing for a more accurate measurement.

Also important, according to Dr. Schuler, are fast calibration times, preferably with calibration able to be performed onsite. “What we use today is a 16-port calibration standard,” he said, “which offers the possibility to automatically calibrate 16 ports in one shot—just connect test equipment to the cal standard and start the autocalibration routine. It is very practical for mass production.” He added that automated calibration is particularly important at EPCOS’s manufacturing plant in Wuxi, China, and he explained that with color-coded cables and connectors, an operator can quickly make the necessary connections and push a button.

Keeping test time short



Figure 1.
  Test for a combined WLAN and WiMAX front-end module extends from S-parameter measurements through harmonic measurements. The OFDM modulation scheme of WLAN and WiMAX devices requires the measurement of EVM (error-vector magnitude) as an indication of linearity.
Dr. Schuler said the team needed to keep test times short despite ever-increasing levels of integration, with modules including active components that require nonlinear measurements. He added that ACPR (adjacent-channel power ratio), harmonics, and other parameters can be measured with a signal-generator and spectrum-analyzer combination, but such a test requires long measurement times over three or four power levels for a full characterization. In contrast, a VNA can quickly measure gain, the 1-dB compression point, and harmonics, said Dr. Schuler, and “The resulting test-time reduction means cost reduction for us.”

Dr. Heide described specific testing challenges posed by highly integrated LTCC front-end modules that also include active components such as power amplifiers. He said that testing such modules involves small-signal measurement of the filter functions inside the ceramic itself as well as large-signal characterization of the amplifier functions also embedded within the module package. Specific tests vary with the application but typically include steps such as S-parameter measurement and harmonic measurements—the latter to ensure compliance with spurious emissions regulatory requirements.

Figure 1 shows test procedure required for WLAN and WiMAX modules. A key requirement for IEEE 802.11 and 802.16 devices, Dr. Heide said, is the linearity of the transmitter operating in OFDM (orthogonal frequency-division multiplexing) format. EVM (error-vector magnitude), he added, is a key indicator of linearity. To implement a comprehensive characterization of modules under development, the EPCOS engineering lab typically employs automated PC-based test stations that include an R&S ZVA24 VNA, a customized multiport test set, an R&S FSQ26 vector signal analyzer, and an R&S SMJ100 vector signal generator.

Dr. Heide explained that a time-consuming test procedure will not be adequate for mass production. “We cannot accept a test that takes half a minute or a minute. We need to complete the test in just a few seconds.”

Testing on a sample basis to speed production is not an option. “We do a full characterization of each and every product leaving our factory,” said Dr. Schuler. He added that EPCOS wanted to minimize the need for test-program adjustments when beginning production on a new module. “Our approach is always to be able to have the same test setup in the lab as we have in the test environment on the production line.”

Dr. Heide said that EPCOS has recently developed a combined module (Figure 2) that supports all worldwide WiFi and WiMAX standards (2.5-GHz WiFi, 2.5-GHz WiMAX, 3.5-GHz WiMAX, and 5.5-GHz WiFi) in a single unit. This tri-band module operates in four modes, he said, with WiFi and WiMAX sharing the 2.5-GHz band while the 3.5-GHz band supports WiMAX only and the 5.5-GHz band supports WiFi only.



Figure 2.  An LTCC tri-band front-end module, implementing 2.5- and 3.5-GHz WiMAX as well as 2.5- and 5.5-GHz WiFi, includes baluns and filters; it also includes power amplifiers and an SP4T switch mounted on the RF-tested LTCC substrate.

The module consists of six baluns, three transmit filters, three receive filters, and three harmonic filters. “That’s a lot of filters to characterize,” said Dr. Heide. The device also includes three power-amplifier chips and an SP4T switch. Its architecture consists of three balanced transmit and three balanced receive paths and one antenna port. As a result, there are 13 RF ports to test—a task for the R&S ZVT VNA.

Integrating the software


Patric Heide and Jörg Schuler discuss production-test concepts for the WiMax/WiFi front-end modules under development in the EPCOS Munich laboratory. 
Photo by Carsten Lerp / NPN Worldwide.
Of course, multiport RF-measurement capability alone isn’t enough to develop an effective test strategy. Software plays a key role, both in controlling the instrumentation and handler and acquiring and analyzing data for statistical-process-control purposes. To that end, Rohde & Schwarz engineers supported EPCOS engineers in the effort to integrate EPCOS’s proprietary test software with the Rohde & Schwarz VNA software. “The big advantage for us,” explained Dr. Schuler, “is that we have a single software interface for controlling the VNA and the switching matrix.”

Despite the emphasis on Rohde & Schwarz instruments, EPCOS engineers do have in their labs instrumentation from other suppliers of measurement equipment. Dr. Heide said that this additional equipment lets EPCOS engineers ensure full compatibility and reproducibility of test results for specific measurements performed by EPCOS customers or reference-design partners, for example. These measurements sometimes use very special digital modulation schemes generated using instruments from multiple vendors.


To fully characterize the FEMs at up to 20 GHz, EPCOS engineers employ a PC-based test station that includes an R&S ZVB20 vector network analyzer, a 10-port switch matrix, an FSQ26 vector signal analyzer, and an SMJ100 vector signal generator. 
Photo by Carsten Lerp / NPN Worldwide.
Nevertheless, EPCOS values the established working model with Rohde & Schwarz. “It can be difficult to work with a test-equipment maker without local support,” said Dr. Schuler, adding that it’s not easy to write down the features you expect to need in three to five years. He continued, “It’s important to work interactively to take full advantage of the capabilities of the test equipment,” because putting together all the pieces of the measurement puzzle requires a continuous dialog between instrument vendor and customer.

Dr. Schuler added that through close cooperation with Rohde & Schwarz customer support, EPCOS also has the opportunity to work with products not yet on the market. “That gives us a chance to provide a lot of feedback, and it lets us make sure the instrumentation is mature when we deploy it in high-volume production.” 


REFERENCES
  1. “LTCC technology: Well embedded,” Components, EPCOS, October 2004. www.epcos.com/en/0959.
  2. Bauernschmitt, Ulrich, et. al., “Compact front-end RF modules,” Components, EPCOS, September 2006. www.epcos.com/en/1035.
FOR FURTHER READING
Bauernschmitt, Ulrich, et al., “Front-end solutions for world phones,” Components, EPCOS, October 2007. www.epcos.com/en/1092.
Hiebel, Michael, Fundamentals of Vector Network Analysis, Rohde & Schwarz, 2007. www.books.rohde-schwarz.com.
Kuther, Thomas, “New dimensions in miniaturization,” Components, EPCOS, September 2006. www.epcos.com/en/1030.
 
 

University ties boost network-analyzer developments

EPCOS engineers’ use of Rohde & Schwarz VNAs grew out of a longstanding relationship between the two companies, according to Christian Evers, head of R&D for network analyzers at Rohde & Schwarz. He said the relationship enabled EPCOS engineers to let their Munich-based neighbor know which features they would need in next-generation test equipment. In turn, it gave Rohde & Schwarz engineers insight into which features the network-analyzer market in general might demand.

Rohde & Schwarz pioneered the network analyzer in 1950, when the company developed the first complex network analyzer—called the Zg diagraph—that enabled the direct measurement of S-parameters. Evers recounted that in 1992, “We made a strategic decision to again focus squarely on the network-analyzer business—not to build a 'me too’ product but a top-level instrument instead.”

In pursuit of that goal, Rohde & Schwarz worked with Professor Burkhard Schiek and his students and colleagues at Ruhr University-Bochum. This relationship led to some vector-network-analysis patents, which are now owned by Rohde & Schwarz.

As it happened, Dr. Werner Faber, then head of operations of the EPCOS SAW division and now a member of the management board and CTO of EPCOS, had earned his PhD at Bochum. The affiliation that both Dr. Faber and Rohde & Schwarz had with Bochum led to a management meeting between Rohde & Schwarz and EPCOS, Evers explained. During the meeting, “We presented what we had in our basket,” he continued, adding that Dr. Faber outlined what features EPCOS wanted to see in network analyzers as EPCOS embarked on its system-in-package development effort (Ref. A).

An initial success, according to Evers, came about because EPCOS test engineers needed to build matching networks to test passive components. The task was time-consuming, and the matching-network tolerances had to be accounted for in the specifications of the SAW devices under test. Evers explained that by relying on one of Professor Schiek’s patents for system error correction, Rohde & Schwarz engineers were able to replace the matching networks with software developed for a network analyzer.

Other cooperative efforts followed. They included integrating Rohde & Schwarz network-analyzer software into the EPCOS production-test software platform, extending multiport capabilities to eight or more ports, and enabling multiport measurements for active components, with work continuing on true differential measurements for active components. Evers added that Rohde & Schwarz has also worked on automated calibration using a 16-port calibration standard in close association with PTB (Physikalisch-Technische Bundesanstalt, the German counterpart to NIST in the US) to ensure traceability.

Evers concluded that Rohde & Schwarz offers to work closely with all its customers, as it does with EPCOS. A close working relationship, he said, “enables us to provide exactly the new features that are needed. In turn, our customers learn how to obtain maximum output from our instruments—which is exactly what we want to achieve.”—Rick Nelson


REFERENCE
A. “A trendsetter in systems,” Components, EPCOS, October 2006. www.epcos.com/en/1037.

 

The evolution of EPCOS

EPCOS, formed as Siemens Components Group in 1968, evolved into the joint-venture Siemens Matsushita Components and went public as EPCOS AG in 1999. The company announced July 31 that it is pursuing a comprehensive partnership with Japan-based TDK Corp., which would result in the formation of a new company, provisionally named TDK EP Components KK. The TDK and EPCOS brands are expected to be retained.

In addition to radio front-end modules, EPCOS makes electrolytic and film capacitors, inductors, ceramic components, and SAW (surface acoustic wave) and BAW (bulk acoustic wave) filters for automotive, telecom, industrial, and consumer applications. The company has 18,300 employees and reported EUR 1.44 billion in sales for its last fiscal year.—Rick Nelson

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