2009 Test Engineer of the Year Nominee:
David Seiler
-- Test & Measurement World, 10/1/2008
SEMICONDUCTOR TESTDavid Seiler
Chief of the Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, National Institute of Standards and Technology
Nominator: Barbara Goldstein, associate director, NIST Electronics and Electrical Engineering Lab
Links to more information about David Seiler's work:
- David Seiler article on Metrology in the Nanoelectronics Era
- Ultra-fast Measurements for Nanoscale Electronics
- Nanoscale Analysis Lab
- World’s First MEMS Standards developed by Seiler’s Lab
- Mission of NIST’s Semiconductor Electronics Division
- Research Projects of Semiconductor Electronics Div. of NIST
- 2009 Conference on Characterization and Metrology for Nanoelectronics
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