Boundary-scan software platform automates complex cluster tests per IEEE 1445
-- Test & Measurement World, 10/7/2008 9:52:00 AM
Goepel electronic has introduced a new series of intelligent tools developed for simulation-based functional test within the System Cascon software platform. The newly developed tools are based on IEEE 1445 Digital Test Interchange Format (DTIF). They enable the application of functional tests for boards and systems with an integrated boundary-scan architecture and provide coupling to the CAE environment of Teradyne’s Lasar simulator.
At the heart of the new tools is an automated test program generator (ATPG) with a software processor for performing pin-fault diagnostics (PFD). Existing functional test sequences in the IEEE 1455 format are automatically transferred by the ATPG to respective boundary-scan pins or virtual I/O channels, and a test program is generated as Caslan/Cascon source code. In parallel, the import of the entire associated fault dictionary into the project database is executed.
Channels, declared virtual can be mapped to nearly every I/O hardware by Goepel’s Hyscan technology at test time. The test program, generated by the ATPG, might be stepwise processed via the integrated multimode debugger, altered, and executed. For all 1149.x components as well as all virtual I/O channels, there is the opportunity to visualize all registers, TAP states and logic levels on nets and pins to support fault analysis. The compiled test programs are cross-compatible to all Goepel electronic boundary-scan controllers. Following the test execution, the PFD performs automatic fault diagnostics at the pin level. Detected faults can immediately be visualized in the layout per integrated ScanVision tool.
“This new solutions allows us to achieve a totally new quality in the combination of structural boundary-scan test and functional cluster test based on a consistent platform,” said Thomas Wenzel, managing director of Goepel electronic’s boundary scan division. “Especially on the field of non-boundary-scan circuitries, our customers will benefit from the significantly improved verification, test, and diagnostic quality, which leads to shorter repair times will be shortened and reduced costs.”
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