FormFactor introduces new wafer-probe-card capability

-- Test & Measurement World, 12/1/2008 7:00:00 AM

FormFactor has introduced DC-Boost, an advanced TRE test technology to increase probe test capacity. The new wafer-probe-card capability enables more efficient use of tester channels on test equipment to double the number of devices that can be tested simultaneously. By using probe cards equipped with FormFactor's DC-Boost technology, IC manufacturers and test service providers can significantly increase test cell throughput on new test equipment, extend the life of their existing test equipment, and reduce their overall cost of test. Tera Probe, a wafer test services provider, is one of several customers adopting the new technology.

"At Tera Probe, our mission is to provide total testing solutions for our customers that boast greater efficiency, lower costs, and ensure higher levels of reliability in order to help them meet their production goals," said Masahide Ozawa, CTO at Tera Probe. "FormFactor's DC-Boost capability supports that mission by allowing us to utilize the latest in advanced wafer test technology to enable more efficient, reliable testing of our customers' product wafers."

As DRAM manufacturers move to tighter design configurations, the number of die per wafer continues to rise, in some cases approaching 1500 die or more. At the same time, test managers are driving to maximize the productivity of their test cells. "Reducing the number of touchdowns in wafer testing is the primary driver for reducing test costs," said Stefan Zschiegner, senior VP of the DRAM product business unit at FormFactor. "Our DC-Boost test technology brings a new degree of intelligence to our wafer probe cards through the integration of application specific ICs—enabling FormFactor to take wafer test parallelism to the next level."

In addition to increasing the DUT (device under test) capacity of test equipment, DC-Boost minimizes drops in voltage that could lead to over-testing or under-testing of devices. The new technology also provides the ability to test devices in isolation to obtain precise voltage measurements. As a result, customers can achieve a more reliable test result, thereby improving yields.

FormFactor's DC-Boost solution is now being offered on the company's PH150XP and Harmony XP probe cards for DRAM wafer testing.

FormFactor, www.formfactor.com.