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Agilent unveils X-parameter nonlinear model generation

-- Test & Measurement World, 1/8/2009 7:00:00 AM

Agilent announced an X-parameter nonlinear modeling technique for modeling components such as amplifiers and transistors commonly used in the wireless and aerospace defense industries. The X-parameters can be generated either from simulation with the company’s ADS (Advanced Design System) EDA software or from its test and measurement instruments.

Previously, designers could not accurately measure, display, and simulate the full amplitude and phase information of each spectral component in nonlinear designs. They also did not have access to a highly accurate nonlinear behavioral model that fully characterizes and describes the nonlinear behavior of their devices. Using Agilent’s X-parameter technology, designers can capture the nonlinear behavior of active components and save them in transportable RF intellectual property for use in RF system or circuit designs in ADS.

Advanced Design System enables X-parameter nonlinear model generation from simulation, allowing design houses to create nonlinear X-parameter models of their RFICs and MMICs; PAMs (power amplifier modules); FEMs (front-end modules); and multiport devices such as mixers. This allows RF and microwave system designers to fully characterize systems early in the design cycle and before the hardware is fabricated. X-parameter models protect the intellectual property from which they are generated, while retaining the full nonlinear characteristics to share with circuit and system design partners.

Users can also generate X-parameter models with load pull characteristics—for accuracy over a wide range of terminating impedances—from ADS simulation or from measurement on an Agilent nonlinear vector network analyzer using the load-pull system from Maury Microwave. With load-pull X-parameter models, designers can accurately simulate and optimize critical transceiver and power amplifier specifications such as cascaded output power, power added efficiency, error vector magnitude and adjacent channel power ratio, eliminating months of prototype iterations with off-the-shelf components.

For more information about the Advanced Design System and X-parameters, visit www.agilent.com/find/eesof-x-parameters.

Agilent Technologies, www.agilent.com.

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