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Jitter and EMC
August 20, 2008

I'm writing this during a technical session at the 2008 IEEE EMC Symposium in Detroit. This year, the Symposium added  a spectial session called "Recent Advances of Jitter and BER Analysis in High-Speed  Serial Links." The  session, which includes six papers, is in addition to the recently added sessions on signal integrity (SI has two technical session this year). The papers presented in the jitter session shows how digital phenomena now affects a product's EMC. EMC engineers may not realize that data patterns can affect EMC, and the presenters have shown that using something that EMC engineers understand: a spectrum scan. A plot clearly showed the difference in emissions when different data patterns in communication links occur.

Although this session was sparesely attended, the IEEE EMC society should try to include this in future EMC conferences. I expect that as EMC engineers understand the correlation between data and EMC, more sill attend such technical sessions.

Posted by Martin Rowe on August 20, 2008 | Comments (0)