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Semicon West
July 26, 2005
This blog has been on a hiatus as I've attended Semicon West and tried to digest the goings-on there. For details, type Semicon in the site-search box above and scroll down to "Test Industry News."
Among the highlights, probing advances are making it easier to measure signals associated with transistors fabricated in deep-submicron processes. Suss MicroTec demonstrated a noncontact probe system that acquires signals from circuits fabricated in 65-nm processes and below without loading the circuit under test. In addition, Zyvex, sharing space with Keithley Instruments, demonstrated the ability to probe individual transistors fabricated in 65-nm processes to enable instruments like the Keithley 4200 SCS to make parametric measurements on those transistors.
In ATE-related highlights, Agilent Technologies entered the packaged-memory-test market with its Versatest Series Model V5500, which targets single-insertion final-test applications for multichip-package devices (MCP) and discrete flash memory. And the Semiconductor Test Consortium saw additional support for its OpenStar standard (scroll down), with Advantest and Apria introducing OpenStar instruments. I'll have more to say on OpenStar in my August Editor's Note. Check back on August 1.
Posted by Rick Nelson on July 26, 2005 | Comments (0)
