Link This |
Email this |
Blog This |
Comments (0)
ITC ’99 keynote spurred test transformation
October 16, 2007
Intel executive Pat Gelsinger's call in 1999 to cut test costs has spurred on a dramatic test transformation that has resulted in a substantial reduction in per-site wafer-probe test. As we approach next week’s
International Test Conference 2007,
TMWorld is fortunate to present an account of eight years of test innovation. Authored by Bill Mann, founder and 16-year general chair of the
IEEE Semiconductor Wafer Test Workshop, the account appears in three parts this week.
Part 1, posted yesterday, covers the emergence of comparatively low cost, DFT-focused, open-architecture testers. Part 2, to be posted tomorrow, emphasizes parallelism and distributed test. Part 3, to be posted Friday, covers yield enhancement, wafer-level burn-in, and collaborative efforts among test-equipment suppliers.
Click here to read part 1.
Posted by Rick Nelson on October 16, 2007 | Comments (0)
