Eye on Standards 
Ransom Stephens- June 28, 2012
In Eye on Standards, Ransom Stephens will be tracking the developments with current, evolving, new, and emerging technology standards and what they mean for you, the test engineer. From the IEEE to ANSI, IEC, and consortiums such as LXI, PXIe, USB, and others, Stephens will be there to help you close the ‘eye’ on your next test project.
Ransom Stephens is a technologist, science writer, novelist, and Raiders fan.
Test Pattern Redemption!
- 01.15.2013
- type: Blog
- 2 Comment(s)
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Long test patterns cause mistakes no matter what equipment you use. Read More...
PRBS31: Slower, costlier, worse
- 09.26.2012
- type: Blog
- 2 Comment(s)
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Is the PRBS31 a good fit for high speed serial testing? Read More...
The very short reach of 25 Gb/s
- 08.31.2012
- type: Blog
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How the OIF-CEI very short reach 25+ Gb/s conductor technology plugs a big hole in 100G communications. Read More...
Samtec out-geeks PCIe’s OCuLink
- 08.15.2012
- type: Blog
- 2 Comment(s)
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Ransom is impressed by a cable, really. Read More...
PCI Express update: the next, next, next generation
- 07.25.2012
- type: Blog
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PCI is twenty years old and PCIe 4.0 supports 16 GT/s. Read More...
DLL-based clock recovery cranks up net bandwidths
- 07.02.2012
- type: Blog
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Measuring ISI at high data rates is impossible
- 06.18.2012
- type: Blog
- 2 Comment(s)
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Test patterns are supposed to stress you out
- 05.31.2012
- type: Blog
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Does OIF have to do everything?
- 05.22.2012
- type: Blog
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Peace at the plugfest
- 04.24.2012
- type: Blog
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