Engineers discuss measurements at DesignCon
January 25, 2012
Engineers have found that using just one or even two instruments isn’t enough to sufficiently characterize high-speed serial devices. On January 31, five engineers will discuss “The Future of Measurements” at DesignCon. The engineers, from Altera, Intel, AMD, PLX Technology, and the University of New Hampshire Interoperability Lab will share their experiences and explain how they use instruments when the cost of equipment is just too high. I’ll be moderating the panel, which will take place at 3:45 pm in Ballroom G of the Santa Clara Convention center.
See you on Tuesday.
Posted by Martin Rowe on January 25, 2012 |
Comments (0)
Industries:
Design, Production Test, and Yield
, Bench and Modular Instrumentation
, Communications Test
Advertisement


















