Subscribe to Test & Measurement World
RSS
Email
Average Rating:
  • (5)
    Rate this:
  • Engineers discuss measurements at DesignCon

    January 25, 2012

    Engineers have found that using just one or even two instruments isn’t enough to sufficiently characterize high-speed serial devices. On January 31, five engineers will discuss “The Future of Measurements” at DesignCon. The engineers, from Altera, Intel, AMD, PLX Technology, and the University of New Hampshire Interoperability Lab will share their experiences and explain how they use instruments when the cost of equipment is just too high. I’ll be moderating the panel, which will take place at 3:45 pm in Ballroom G of the Santa Clara Convention center.

    See you on Tuesday.

    Posted by Martin Rowe on January 25, 2012 | Comments (0)
    Average Rating:
  • (5)
    Rate this:
  • POST A COMMENT
    Display Name
    captcha

    Before submitting this form, please type the characters displayed above. Note the letters are case sensitive:

    Advertisement
    Advertisement
    Advertisement
    About Us   |   Advertising Info   |   Site Map   |   Contact Us   |   FREE Subscription
    © 2011 UBM Electronics . All rights reserved.
    Use of this Web site is subject to its Terms of Use | Privacy Policy

    Feedback Form
    Feedback Analytics