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Patrick Mannion, editor in chief of Test & Measurement World and EDN, comments on test, globalization, measurement, machine vision, economics, nanotechnology, the engineering profession, and topics of general interest.

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December 2005

Wednesday, December 28, 2005

Intelligent Design, and Happy Holidays


Wednesday, December 21, 2005

The incredible shrinking chip part 2


Tuesday, December 20, 2005

The incredible shrinking chip


Thursday, December 15, 2005

Ideas in Electronics for 2005


Tuesday, December 13, 2005

Broadband over powerline vs. ham radio


Tuesday, December 6, 2005

Art controlling science


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