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Patrick Mannion, editor in chief of Test & Measurement World and EDN, comments on test, globalization, measurement, machine vision, economics, nanotechnology, the engineering profession, and topics of general interest.

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December 2006

Tuesday, December 26, 2006

Holiday probability and statistics


Friday, December 22, 2006

The Scrooge report


Friday, December 22, 2006

Let entropy reign


Wednesday, December 20, 2006

Celebrating misers


Monday, December 18, 2006

Tell us about the misers…


Saturday, December 16, 2006

Time for a wallet makeover


Friday, December 15, 2006

Interested in creativity?


Wednesday, December 13, 2006

The right to bear cell phones


Tuesday, December 12, 2006

Buy a girl a planetarium


Thursday, December 7, 2006

Repairing iPods


Wednesday, December 6, 2006

Modest proposal for iPods


Tuesday, December 5, 2006

ISSCC to address test topics


Monday, December 4, 2006

Pity the luxury-car makers


Friday, December 1, 2006

Sniffer looks for ISM signals


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