Taking the Measure

Patrick Mannion, editor in chief of Test & Measurement World and EDN, comments on test, globalization, measurement, machine vision, economics, nanotechnology, the engineering profession, and topics of general interest.

October 2009

Saturday, October 31, 2009

50-year-old "Style" relevant to 21st century tech writing

Thursday, October 29, 2009

Weak economy, anti-immigrant sentiment hits H-1B visa program

Tuesday, October 27, 2009

Where does lithium come from?

Monday, October 26, 2009

Is GPS destroying our brains?

Friday, October 23, 2009

Ford, University of Michigan look to simulation for hybrid design

Thursday, October 22, 2009

Protectionism not the answer, US beneficiaries of trade should speak up

Monday, October 19, 2009

Tough problem? Nonsense!

Friday, October 16, 2009

Texas governor touts $160 million for STEM

Wednesday, October 14, 2009

STEM initiative could foster competition

Sunday, October 11, 2009

Brin effectively defends Google Books

Friday, October 9, 2009

Suggest dev kit to colleague, pay $11,000 to FTC

Thursday, October 8, 2009

Wi-Fi-proof paint

Tuesday, October 6, 2009

Down with texting while driving, but save the handoff

Monday, October 5, 2009

Clunker of a program gets clunky results

Monday, October 5, 2009

Biometrics--useful for consumer transactions?

Thursday, October 1, 2009

Signal integrity to be addressed at wafer conference

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Taking the Measure

Metric system rears ugly head in US election (56)

Too late to bail out NASCAR? (34)

GM in cahoots with EPA makes up 230-mpg number (33)

Is the US becoming a third-world country of innovation? (33)

Stupid consumers plague CE industry (30)

October 2009

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