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  • Design and test highlights at the microwave show

    June 15, 2009

    I attended the IEEE MTT-S International Microwave Symposium last week, where I saw a variety of design and test products, ranging from RF-friendly EDA tools to high-volume production-test-worthy instruments. Of particular note was an emphasis on the 60-GHz ISM band for HD transmission within the home. Here are some highlights (click each link for details):

    • Keithley upgrades RF vector signal analyzer, introduces upconverter.

    • Design mingles with test as Agilent’s Solomon touts measurement focus.

    • Noisecom, Rohde & Schwarz demo 60-GHz noise-figure measurement.

    • Giga-tronics introduces fast-switching 50-GHz signal generators.

    • National Instruments highlights WiMAX test.

    • Anritsu debuts VNAs and power sensors.

    • Tektronix addresses RF/Microwave challenges, hosts Mesuro at IMS booth.

    • Aeroflex expands PXI platform with high-power signal generators.

    • Boonton introduces peak power sensor.

    • Rohde & Schwarz demos coherent-source, nonstandard-OFDM, and group-delay measurements; touts AWR link.

    • Nokia exec touts open innovation.

    • Synopsys releases Custom Designer 2009.06, touts RF prowess.

    • CST highlights simulation and solver tools.

    • Crystek debuts pocket reference oscillator.

    • Richardson Electronics adds test product line from W L Gore.

    • Centellax previews 10-MHz to 50-GHz power amplifier.

    Also, read our preshow interview with Fred Schindler, general chair of this year’s IMS and director of RF Micro Devices’ Boston Design Center.

    Posted by Rick Nelson on June 15, 2009 | Comments (0)
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