Product news and application stories covering bench and modular instrumentation used in electronics testing.
From 14-sample/s DAQ to 6.6-GHz PXI—with a helping of software 08/13/2008
Introductions by National Instruments at its annual NIWeek event included LabView version 8.6, Wi-Fi and Ethernet data-acquisition devices, 6.6-GHz PXI RF signal analyzers and generators, and reconfigurable I/O (RIO) devices. The company, in conjunction with Lego, announced a new educational robotics product. More
B&K Precision switcher provides USB charging port 08/19/2008
The Model 1550 AC/DC switching power supply from B&K Precision offers a front-panel USB charging port that you can use to conveniently charge a cell phone or MP3 player.
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Elma's catalog showcases its rotary switches 08/19/2008
This comprehensive catalog presents Elma Electronic's complete line of rotary switches, including coded switches, encoders, selector switches, keylock switches, audio switches, knobs, and accessories.
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IMI releases vibration monitoring instrumentation brochure 08/19/2008
PCB Piezotronics offers a short-form brochure highlighting its latest accelerometers, vibration transmitters, switches, meters, cables, connectors, and accessories for condition monitoring and predictive maintenance of industrial machinery.
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Speed, flexibility key for RF PXI instruments Rick Nelson, Editor-in-Chief - 08/07/2008
National Instruments announced this week that it is extending the measurement range of its PXI RF instrument lineup beyond 6 GHz.
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Agilent introduces low-cost, feature-rich DC supplies 08/05/2008
A low-cost expansion of the Agilent E3600 Series, the U8000 Series of single-output, nonprogrammable DC power supplies offers features that are typically found in costly programmable models.
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Goepel boundary-scan I/O modules test PCI Express slots 08/05/2008
The CION Module/PCIe-x1 and CION Module/PCIe-x4 from Goepel enable structural test coverage of x1 PCI Express and x4 PCI Express slots in compliance with IEEE 1149.1 and IEEE 1149.6 standards.
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ROWE'S AND COLUMNS Martin Rowe, Senior Technical Editor, Test & Measurement World August 20, 2008 Jitter and EMC
I'm writing this during a technical session at the 2008 IEEE EMC Symposium in Detroit... More
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