• Add-ins customize Agilent compliance software

  February 10, 2012
  An enhancement to Agilent's N5467A user-defined application software gives engineers the ability to develop extensions that can be plugged into existing Infiniium compliance applications.  More

• Digitizer runs 16 bits at high speed

  February 8, 2012
  The ATS 9625 digitizer card from Alazar Tech contains two analog-input channels that simultaneously sample at speeds up to 250 Msamples/s.  More

• Test op-amps for input bias current

  David R. Baum and Daryl Hiser, Texas Instruments, February 6, 2012
  Input bias currents are sources of error in operation amplifiers. Measuring them is important, not just op-amp manufacturers but for engineers designing them into circuits and systems. Two circuits can measure bias current. The choice depends on the magnitude of the current.  More

• Goepel adds PXI unit to LIN interface module line-up

  February 6, 2012
  Goepel Electronic has expanded its range of LIN communication controllers for testing electronic control units with the introduction of the PXI 3078, a module that provides two LIN bus or K-Line interfaces and supports LIN specifications 1.3, 2.0, and 2.1.  More

• Test products showcased at DesignCon 2012

  Martin Rowe, February 3, 2012
  Oscilloscopes, network analyzers, and waveform generators highlight annual conference  More

• Waveform analyzer plug-in smokes at 50 GHz/32 Gbps so engineers can stay cool

  Bill Schweber, February 2, 2012
  Santa Clara, CA — 86108B precision waveform analyzer module from Agilent for their 86100C/D DCA wide-bandwidth oscilloscope family targets engineers testing high-speed serial links. Agilent demonstrated the modules and hit hst at DesgiCon 2012.  More

• Panel probes T&M’s tech chiefs

  Rick Merritt, EE Times, February 2, 2012
  A DesignCon panel probed the leaders of the major test and measurement companies on a broad range of issues. All agreed test problems are becoming increasingly thorny, and at least one member of the audience gave panelists flak for not doing enough to solve customers' toughest challenges.  More

• T&MW announces winners of 2012 Best in Test awards

  February 1, 2012
  At a ceremony held January 31 in Santa Clara, CA, the editors of Test & Measurement World recognized the winners of the 2012 Best in Test and Test of Time awards and also announced that Brad Davis of Broadcom was voted the Test Engineer of the Year.  More

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