Product news and application stories covering bench and modular instrumentation used in electronics testing.
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Geotest and Pickering announce PXI Website
March 18, 2010The site describes the types of products the companies make and links directly to descriptions of the products on each company's own Website. In addition, it includes links to other sources of information. More -
PXI system gets MIMO capabilities
March 18, 2010Aeroflex has added support for MIMO (multiple-input/multiple-output) testing to its PXI 3000 Series manufacturing test system. More -
Kistler triaxial accelerometers leverage low-mass design
March 17, 2010PiezoBeam Type 8688A triaxial accelerometers from Kistler Instrument simultaneously measure vibration in three orthogonal axes. More -
Acces I/O's USB modules furnish up to 16 analog outputs
March 17, 2010Comprising 10 small-form-factor modules, the USB-AO series from Access I/O Products offers 4, 8, or 16 single-ended analog outputs with 12-bit or 16-bit resolution, as well as a high-speed USB 2.0 interface. More -
Elma rolls out compact enclosure family
March 16, 2010A flexible modular design and simple construction enable the MiniBox 34 family of enclosures from Elma Electronic to serve a wide range of applications and address both desktop and wall-mount requirements. More -
Sherborne debuts new series of MEMS accelerometers
March 11, 2010Sherborne Sensors MEMS-based solid-state accelerometers in the A700 series measure single-axis and dual-axis vector acceleration in applications where space is at a premium. More -
Rice Lake unveils fast digital diagnostic junction box
March 10, 2010Rice Lake Weighing Systems claims that the iQUBE2's unmatched reaction time affords the highest levels of accuracy and precision for mission-critical applications. More -
IAS to conduct ISO/IEC Standard 17025 training event
March 8, 2010The International Accreditation Service (IAS) will hold a special ISO/IEC Standard 17025 training program which will run from May 24 through May 26. More
News from the Web
MEMS Solid State Precision Accelerometers Accurate to ±1 milli-g
Source: www.measurementdevices.com
Date: 03-04-2010 08:00:00 GMTASTM Rim Slip Performance Test Standard
Source: measurementmedia.com
Date: 02-14-2010 09:00:00 GMTproductronica looks to the future with a new management team : Electronics News from
Date: 21 hours 7 minutes 30 seconds ago.Ciena closes Nortel acquisition
Source: www.lightwaveonline.com
Date: 03-19-2010 22:59:15 GMTSingle-Chip Microprocessor Controlled Optical Power Meter
Date: 03-19-2010 21:27:51 GMT
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Earliest article I have on diode temperature sensing is "Solid-State Probe...
anonymous– 3/12/2010 6:49:17 AM EST
in response to Test Ideas: Bias current modulation eliminates wiring errorsTo expand upon the above information, a four channel iQUBE2 junction box will...
Tony Boehm– 3/10/2010 3:20:28 PM EST
in response to Rice Lake unveils fast digital diagnostic junction boxNicely done. I recommend engineers read William Zinsser's book, "On Writing...
Jon Titus– 3/4/2010 3:41:36 PM EST
in response to Boost your engineering career (Guest commentary)HelloI am surprised that there is no reference to Agilent PXI digitizers in...
Santosh Reddy N– 3/2/2010 6:28:58 AM EST
in response to PXI keeps pushing envelope
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