• Rohde & Schwarz simplifies measurements on LTE devices

  February 8, 2012
  Rohde and Schwarz's open switch and control platform (OSP) equipped with the OSP-B155 option can be used to measure radiated spurious emissions (RSE) on LTE devices.  More

• T&MW announces winners of 2012 Best in Test awards

  February 1, 2012
  At a ceremony held January 31 in Santa Clara, CA, the editors of Test & Measurement World recognized the winners of the 2012 Best in Test and Test of Time awards and also announced that Brad Davis of Broadcom was voted the Test Engineer of the Year.  More

• Product Round-Up: Software for test and measurement applications

  January 26, 2012
  Looking for test software? Check out these recently released or updated software products that can aid you in your test, measurement, and inspection applications.  More

• Narda triples EMC test range of digital receiver

  January 16, 2012
  An EMC/EMI receiver unit from Narda Safety Test Solutions not only extends the frequency range of the PMM 9010 receiver system to 18 GHz, but also directly connects to an antenna inside a test chamber.  More

• Chroma Systems Solutions acquires QuadTech

  January 16, 2012
  Expanding its capabilities to the Eastern US, Chroma Systems Solutions announced the acquisition of Massachusetts-based QuadTech, a provider of electrical safety test equipment and systems.  More

• DesignCon 2012: How can T&M meet designers' needs?

  January 11, 2012
  A panel discussion scheduled for DesignCon 2012 will look at the nature of test and how test technology is evolving to meet the needs of designers.  More

• Teseq adds RF switch unit to immunity test system

  December 29, 2011
  Teseq has extended the capabilities of its ITS 6006 radiated immunity test system with the SW 6012 RF switch unit, which furnishes two SPDT relay switches at up to 12.4 GHz.  More

• Opera multiphysics simulation tool speeds EM design

  December 20, 2011
  Version 15 of the Opera electromagnetic simulator from Vector Fields Software adds 3-D mechanical-stress analysis that solves for deformations within the elastic limit of materials.  More

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