Design, Production Test, and Yield
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Distributors hone 'traffic' control skillsBolaji Ojo, Editor in Chief, EBN, May 7, 2012Component distributors occupy a central position in the electronics supply chain, acting like traffic officers to move parts and services swiftly and efficiently from suppliers to contract manufacturers and OEMs. Their role is increasingly significant, yet distributors sometimes are still treated as bit players. More
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Goepel debuts ChipVORX JTAG I/O moduleMay 7, 2012Offering 90 I/O channels, the FXT-X90 FPGA-based I/O module is controlled via a standard TAP to enable access to the entire ChipVORX line of test and programming IP for external instrumentation. More
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KLA-Tencor adds intelligence to wafer inspectionR. Colin Johnson, EE Times, May 2, 2012By adding intelligent parallel processing, KLA-Tencor has increased the throughput of its CIRCL wafer inspection and metrology tool by as much as four times. More
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Article series explains op-amp measurementsMartin Rowe, Senior Technical Editor, May 1, 2012Operational amplifiers require numerous measurements, both by their manufacturers and by the engineers who are designing them into circuits and systems. More
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Researchers find semiconductor derivative of graphenePeter Clarke, EE Times, April 30, 2012Until now, graphene and its derivatives have only existed as conductors and insulators. More
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Introduction to IEEE 802.11ac manufacturing test requirementsRobin Irwin, Aeroflex, Inc., April 24, 2012To be prepared, manufacturing test engineers need to ensure that their test equipment is capable of supporting the new 802.11ac test requirements, as well as existing and complementary technologies. More
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QualiSystems' TestShell 4.7 streamlines lab testingApril 24, 2012With TestShell 4.7 software for lab management, device provisioning, and test automation, manual testers are able to incorporate automated elements into the labor-intensive process of lab testing. More
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Improve production test of high-speed RF componentsPeter Sarson, austriamicrosystems, April 11, 2012Moving component testing for any device from the bench to production ATE (automatic test equipment) poses many challenges, but moving the testing of high-speed RF devices to a production setting can be downright daunting. More
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Multi-TAP JTAG controller fits Teradyne ICTsApril 11, 2012Following the introduction of a single-channel JTAG controller, Corelis has launched the four-channel QuadTAP/CFM to integrate boundary-scan test capabilities into Teradyne in-circuit testers. More
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Fluke 62 Max+ IR thermometer uses dual lasersMartin Rowe, April 9, 2012Fluke's 62 Max+ ($129.95) uses two rotating laser pointers that show you the size of the measurement area. More
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E-handbook covers nano electrical measurementsApril 9, 2012Keithley Instruments announced its latest e-handbook, Advances in Electrical Measurements for Nanotechnology, aimed to help you ensure the accuracy of your nanoscale electrical measurements. More
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Tips for testing processor coresRon Press, Mentor Graphics, April 6, 2012You can structure the test aspects of the processor core in a manner that makes them effective and predictable, regardless of the IC design. More
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Real-time control platform teams with LabViewApril 6, 2012National Instruments' Alliance Partner S.E.A. Datentechnik has launched BMX, a real-time monitoring and control platform for embedded applications that is programmable using LabView. More
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Compliance and conformance: testing to new IEEE standardsPeter Lefkin, Managing Director, ICAP, April 5, 2012The IEEE Conformity Assessment Program (ICAP) bridges the gap between standards and conforming products. More
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Boundary-scan package integrates digital oscilloscopeApril 4, 2012XJTAG and Pico Technology have joined forces to produce XJTAG Expert, an integrated JTAG boundary-scan oscilloscope in a compact, portable package that requires just two USB connections. More
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Multitest publishes tutorial on Kelvin contactorsApril 3, 2012Free for downloading, Multitest's 26-page illustrated tutorial not only explains how Kelvin connections work and when they are needed, but also provides practical recommendations for their use. More
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Cadence webinars address functional verificationApril 2, 2012Now through June, Cadence will be offering a series of webinars to present the latest techniques, best practices, methodologies, and support services for designing and verifying silicon designs. More
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Testing opportunitiesJanine Sullivan Love, April 1, 2012About 17 years ago, I joined the high-tech world of electrical engineering. Since then, I have been fortunate enough to get some of the first glances at new semiconductor processing materials and technologies. More
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iNEMI planning MEMS test initiativesApril 1, 2012iNEMI (International Electronics Manufacturing Initiative) has begun driving two collaborative efforts that will focus on reliability and testing issues for MEMS technologies. Using information gathered for the 2011 iNEMI Roadmap, the organization has identified several issues that must be addressed for the MEMS industry to move forward. More
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Multitest outfits pick-and-place handler for MEMS testMarch 29, 2012Multitest has expanded its MEMS portfolio to pick-and-place applications with the introduction of a test and calibration cart for the MT9510 pick and place handler. More
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