Viewpoint
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Getting a handle on electrical safetyLawrence D. Maloney, Contributing Editor, May 1, 2011Rod Taylor of Seaward Group discusses trends in safety and compliance test. More
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Why it pays to test before you flyLarry Maloney, Contributing Editor, April 1, 2011John Monahan of RT Logic says that for aerospace applications, users must be able to absolutely trust that a test instrument will give accurate stimulus and measurement. More
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Taking on the RF challengeBy Larry Maloney, Contributing Editor, March 1, 2011According to Paul Genova, CEO of Wireless Telecom Group, all high-speed serial-data components need to work together, regardless of manufacturer or how these components are combined in a device. More
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Payoffs from merging design and testBy Larry Maloney, Contributing Editor, February 1, 2011According to The MathWorks fellow and chief strategist Jim Tung, simulating system behavior under different conditions and parameters results in a more mature, better-vetted design at the testing stage. More
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How ATE keeps pace with customersLarry Maloney, Contributing Editor, December 22, 2010
Keith Barnes, Chairman of Verigy, discusses new automated test equipment technology for semiconductor test.
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How test targets time to marketBy Larry Maloney, Contributing editor, November 1, 2010Amir Aghdaei, president of Tektronix, discusses the technical challenges and dominant applications targeted for the broad range of Tektronix instruments. More
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What engineers want in DAQ systemsBy Lawrence Maloney, Contributing Editor, October 1, 2010Fred Molinari, president and founder of Data Translation, says, "There's often a good opportunity for progress at what I call the 'edge,' when two factors converge, such as analog and digital." More
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Strong rebound for semiconductor testBy Larry Maloney, Contributing Editor, September 1, 2010Mark Jagiela, president of Teradyne Semiconductor Test Division, says that compared to other sectors of the economy, "the rebound in electronics and semiconductors has been breathtaking." More
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Testing meets a multimedia digital tsunamiBy Larry Maloney, Contributing Editor, August 1, 2010Atul Bhatnagar, president and CEO of Ixia, talks about test challenges and solutions in wired and wireless networks. More
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How PXI fuels test's recoveryBy Larry Maloney, Contributing Editor, July 1, 2010Loofie Gutterman, president of Geotest-Marvin Test Systems and president of the PXI Systems Alliance, discusses developments in PXI and other test industry trends. More
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How new products challenge audio testBy Larry Maloney, Contributing Editor, June 1, 2010Bruce Hofer discusses the changes in the audio test field brought on by the expanding variety of consumer electronic products. More
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One-box solutions score with engineers (continued)Larry Maloney, Contributing Editor, May 1, 2010A continuation of our interview with Michael Vohrer, president and CEO of Rohde & Schwarz, which appeared in the May 2010 Viewpoint column. More
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Strategies for making vision affordable (continued)By Larry Maloney, Contributing Editor, April 1, 2010A continuation of our interview with Brian Doody, CEO of Dalsa, which appeared in the April 2010 Viewpoint column. More
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Strategies for making vision affordableBy Larry Maloney, Contributing Editor, April 1, 2010Brian Doody, CEO of Dalsa, shares his thoughts about the business recovery in machine vision and the technologies that are leading the comeback. More
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Innovating through economic downturnsBy Larry Maloney, Contributing Editor, March 1, 2010Barbara Hulit, president at Fluke, shares her thoughts about the company's expanding stable of test and measurement technologies. More
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Innovating through economic downturns (continued)By Larry Maloney, Contributing Editor, March 1, 2010A continuation of our interview with Barbara Hulit, president of Fluke, which appeared in the March 2010 Viewpoint column. More
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Where reliability meets flexibilityBy Larry Maloney, February 1, 2010Christopher A. Beronio of W.L. Gore & Associates shares his views on cable assemblies for test applications that are shaping future products. More
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Wireless: prime engine for communications testLarry Maloney, December 1, 2009Hiromichi Toda, President of Anritsu, discusses developing instrumentation for the communications market and other specialized applications. More
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Testing for mission-critical applicationsLarry Maloney, Contributing Editor, November 1, 2009James Mulato, President of EADS North America Test and Services, discusses the development of test platforms for the defense, commercial aerospace, and semiconductor markets. More
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Rebound ahead for semiconductor testLarry Maloney, Contributing Technical Editor, October 1, 2009R. Keith Lee, President and CEO of Advantest America, discusses new technologies for semiconductor test and emerging applications that will boost the industry. More
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