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Semicon West: What leading vendors predict
Gail Flower, Contributing Editor, July 28, 2009During the Executive Test Summit, held during Semicon West 2009, executives from LTX-Credence, Advantest America, Verigy, and Teradyne shared their visions for the future of the semiconductor test industry. More -
Semicon West Wrap-up: Market expectations; products on exhibit
Rick Nelson, Editor in Chief, July 22, 2009Semicon West 2009 offered mixed messages on the economic prospects for the semiconductor industry and semiconductor equipment market, including the market for test equipment. More -
Semicon West: Teradyne touts RF market share, displays Eagle Test systems
Rick Nelson, Editor in Chief, July 16, 2009Teradyne's wireless device test instruments, the Gen4 Microwave and UltraWave 12G, handle test of RFICs and RF SOCs aimed at wireless LAN, Bluetooth, set-top box, 3G and 4G cellular, WiMAX, and LTE applications. More -
Semicon West: Industry takes aim at 22-nm interconnect stack
Ron Wilson, Executive Editor, EDN, July 14, 2009Ron Wilson of EDN reports that researchers are discovering that 22 nm may be beyond the end of the sidewalk for much of the technology we use today to fabricate the interconnect stack on ICs. More -
Semicon West to feature Executive Test Summit
July 10, 2009During the July 14 event, four industry leaders will discuss how economic challenges threaten continued innovation in the semiconductor test industry. More
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