Design Production Test and Yield

Industry news, industry trends, and applications for engineers involved in production testing of wafers, semiconductors, printed circuit boards, and subsystems.

Cascade Microtech addresses power semiconductors and RFICs
07/02/2009
Cascade debuted probes that make Tesla compatible with the Agilent B1505A, and it introduced 60- to 80-GHz probes for engineering an production test. More

NI introduces PXI modules and chassis for automated test
07/01/2009
The NI PXIe-6544/45 digital waveform generator/analyzers, which support clock rates of up to 100 and 200 MHz, and the eight-slot NI PXIe-1082 chassis are aimed at high-speed semiconductor device and HD multimedia testing. More
Verigy introduces redundancy analysis option for its V6000 WS memory test system
07/01/2009
Verigy has introduced SmartRA (Scalable Memory Redundancy Technology), a memory redundancy analysis option for its V6000 WS wafer-sort memory-test system. More
2009 Buyer's Guide
07/01/2009
Our 2009 Buyer's Guide contains more than 60 product and service categories, divided into five main sections with a total of 16 subsections. Each section includes hotlinked vendor names and a sampling of products from the past year. More
Design and test firms address microwave challenges
Rick Nelson, Editor in Chief - 07/01/2009
Exhibits at 2009 IEEE MTT-S International Microwave Symposium ran the gamut from design and simulation through high-speed production test. More
When robots meet vision
Larry Maloney, Contributing Technical Editor - 07/01/2009
Adding machine vision to a production process presents a challenge to most engineers, but what happens when you combine vision with robotics? The answer is that it's no walk in the park, yet more and more companies are pairing the two technologies. More
Electrical & Physical Environmental Test: 2009 Buyer's Guide
07/01/2009
Use our updated buyer's guide to find the products you need. More
ATE/DFT/BIST: 2009 Buyer's Guide
07/01/2009
Use our updated buyer's guide to find the products you need. More
Next »

News from the Web

Power Cords And Cordsets Readied For Brazilian Market
Source: www.eepn.com
Date: 17 hours 11 minutes ago
Western Australia leads national ICT job decline
Source: reseller.co.nz
Date: Jul 3, 2009
Wanted: Open & Inquiring Minds: Challenge ICT industry's top names and explore future visions at ITU TELECOM WORLD 2009 Forum
Source: www.responsesource.com
Date: Jul 2, 2009
Improved Collaboartion Across Government Agencies Key To Meeting Public Sector 'Green ICT' Targets
Source: newsroom.cisco.com
Date: Jul 2, 2009
WA leads national ICT job decline
Source: www.arnnet.com.au
Date: Jul 2, 2009

View All Stories

Featured Company

National Instruments

For the past 30 years, National Instruments has been a technology pioneer and leader in virtual instrumentation - a revolutionary concept that has changed the way engineers and scientists in industry, government, and academia approach measurement... more

Most Recent Resources

SPONSORED LINKS

Blogs
Talkback
Webcast

ENGINEERING EDUCATION AND CAREERS
Jennifer Kempe, Contributing Editor, Test & Measurement World
July 1, 2009
Concrete canoes hold water
Brains and brawn united at the 22nd annual National Concrete Canoe Competition (NCCC)...
More

TAKING THE MEASURE
Rick Nelson, Chief Editor, Test & Measurement World
June 29, 2009
Rick’s Short Circuit: Be very afraid of cyber warfare, don’t be afraid of innovation
In the Wall Street Journal, L. Gordon Crovitz expresses concern that the Obama a...
More

Rowe's and Columns
Martin Rowe, Senior Technical Editor, Test & Measurement World
June 23, 2009
Keep those legacy GPIB cards or upgrade?
A recent discussion on the Agilent Vee e-mail user group highlights a common problem ...
More

» VIEW ALL BLOGS

hi can anyone tell m.if we can use this for real time signal or not.........and if c...
nawraj - 6/24/2009 12:25:21 AM PT
in response to Serial port controls ADC

Interesting method, however it seems a lot more complicated than an instrumentation a...
Edward A. Nauman - 6/21/2009 8:33:50 PM PT
in response to Program resistance in a bridge circuit

This article did not adequately go into the need for a program resistance bridge circ...
Darrell Feldbusch - 6/3/2009 11:15:03 AM PT
in response to Program resistance in a bridge circuit

The right URL is www.sensorsportal.com...
Sergey Y. Yurish - 6/2/2009 1:26:54 PM PT
in response to IFSA releases evaluation board for sensor-system development

» VIEW ALL TALKBACK THREADS

Signal Integrity Design Using Fast Channel Simulation and Eye Diagram Statistics

FCoE Test Challenges

EM Tools for Designing Circuits, Packages, and Connectors

4G MIMO Antenna Design on a Small Budget

Power Supply Measurement and Analysis

View All Webcasts

T&M Challenge

T&M Challenges

July 2009

RF/Microwave Challenge
Question: Which statement about RF/microwave power-amplifier design and test with respect to nonlinear behavior is true?
Prize: $300 American Express gift card
Sponsor: Test & Measurement World
Take the RF/Microwave Challenge