Carl Zeiss offers laser scanning microscope 05/07/2008
The LSM 710 laser scanning microscope from Carl Zeiss boasts increased sensitivity, a higher signal-to-noise ratio, and improved flexibility for new fluorescence dyes and multimodal experiments.
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Micro Photonics offers micro-CT attachment for SEMs 05/07/2008
The Skyscan microtomography (micro-CT) attachment for scanning electron microscopes (SEMs) produces 3-D images that reveal the internal 3-D microstructure of an object without requiring any sample preparation.
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Electrons remain important in electronics test Rick Nelson, Editor in Chief, rnelson@tmworld.com - 05/01/2008
Test engineers are struggling to optimize PCB test and inspection strategies as board complexity increases and manufacturing gets outsourced. Finding the right mix of test and inspection technologies was the topic of a panel at APEX.
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Vision algorithms by the book Jon Titus, Contributing Technical Editor, jontitus@comcast.net - 05/01/2008
Many engineers who work with machine-vision software don't care to know how algorithms process images to produce inspection data. But if you want to learn more about how vision software works, you may find value in this new book.
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Test, inspection technologies target PCB quality 05/01/2008
Agilent Technologies' new Medalist sj5000 AOI platform and CheckSum's MultiWriter pps onboard gang programming system are just a few of the product announcements from the APEX 2008 show floor.
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Learn about machine-vision lighting Steve Scheiber, Contributing Technical Editor - 04/22/2008
To help you illuminate your products properly, National Instruments has posted three tutorials to its Web site that cover the topic of lighting in machine-vision systems.
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Don't overspecify machine-vision cameras Steve Scheiber, Contributing Technical Editor - 04/22/2008
Bruce Butkus of Edmund Optics recommends that you concentrate on the type of camera and lens you actually need rather than adding unnecessary "fudge factors" to your specifications.
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Rowe's and Columns Martin Rowe, Senior Technical Editor, Test & Measurement World March 4, 2008 Measurement in the hospital
I'm about to be discharged from the hospital after three long days. Despite all the m... More
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