2008 Test Engineer of the Year Nominee: Pat McGinnis
Test Measurement World Staff- October 1, 2007
Electrical Engineer, IBM Systems & Technology group
Describing McGinnis' work, Eric Barna, manager of Microtest development engineering and operations at IBM, said, "Pat McGinnis, electrical engineer, IBM Systems & Technology group, works in the Microelectronics test development Image lab. The lab provides fault localization and diagnostics for 300-mm product and process development. Pat is the lead engineer of a multifaceted team which develops functional ATE programs and hardware interfacing. The team’s efforts allow for full functional test, while simultaneously performing static and dynamic emissions or laser stimulation analysis.
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"Pat has performed full test and image-based diagnostics on the latest dual-core IBM POWER6 processor, the STI [Sony, Toshiba, IBM] Cell processor, the XBOX 360 game chip, and the Nintendo PowerPC game processors. Pat has also performed test and image diagnostics on dozens of SRAM, EDRAM, and ASICs. During this same period, Pat and his team have also provided key fault localization for 45-nm, 32-nm and LP (low power) process functional test macros."
Read more about McGinnis' company and his work:
Read about semiconductor products that received test and image-based diagnostics by Pat McGinnis and his team:
IBM Power6 processor, which offers increased performance and capabilities to UNIX and Linux clients.
XBOX processor, a specialized chip designed and developed by IBM and Microsoft to meet the unique requirements of the next generation Xbox 360 console.
Cell, an advanced Power Architecture-based microprocessor optimized for compute-intensive workloads and broadband media applications, such as computer entertainment, movies and other forms of digital content.
CMOS10LP, an image sensor process technology ranging in transistor size from 0.5 um to 65 nm.
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